发明公开
EP2572207A2 MICROMACHINED ON-WAFER PROBES AND RELATED METHOD
审中-公开
MIERROGEFERTIGTE ON-WAFER-SONDEN UND VERFAHRENDAFÜR
- 专利标题: MICROMACHINED ON-WAFER PROBES AND RELATED METHOD
- 专利标题(中): MIERROGEFERTIGTE ON-WAFER-SONDEN UND VERFAHRENDAFÜR
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申请号: EP11818499.3申请日: 2011-05-20
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公开(公告)号: EP2572207A2公开(公告)日: 2013-03-27
- 发明人: WEIKLE, II, Robert M. , LICHTENBERGER, Arthur Weston , BARKER, Nicolas Scott , RECK, Theodore James , XU, Haiyong , CHEN, Lihan
- 申请人: University of Virginia Patent Foundation
- 申请人地址: 250 West Main Street, Suite 300 Charlottesville, VA 22902 US
- 专利权人: University of Virginia Patent Foundation
- 当前专利权人: University of Virginia Patent Foundation
- 当前专利权人地址: 250 West Main Street, Suite 300 Charlottesville, VA 22902 US
- 代理机构: Appelt, Christian W.
- 优先权: US201161484004P 20110509; US347013P 20100521
- 国际公布: WO2012024007 20120223
- 主分类号: G01R31/26
- IPC分类号: G01R31/26 ; H01L21/66
摘要:
A micromaching process to fabricate a single chip that simply drops into a supporting structure. The micromaching process provides the ability to create a probe that will interface with integrated circuits, for example, operating at frequencies in the range of about 100GHz to about 3,000 GHz (3 THz). This approach creates a silicon structure (or other applicable choice of material) that provides mechanical force for probing while supporting the transfer of the high frequency energy between a measurement system and the integrated circuit, individual device or material.
公开/授权文献
- EP2572207B1 MICROMACHINED ON-WAFER PROBES AND RELATED METHOD 公开/授权日:2020-07-15
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