发明公开
EP2572207A2 MICROMACHINED ON-WAFER PROBES AND RELATED METHOD 审中-公开
MIERROGEFERTIGTE ON-WAFER-SONDEN UND VERFAHRENDAFÜR

MICROMACHINED ON-WAFER PROBES AND RELATED METHOD
摘要:
A micromaching process to fabricate a single chip that simply drops into a supporting structure. The micromaching process provides the ability to create a probe that will interface with integrated circuits, for example, operating at frequencies in the range of about 100GHz to about 3,000 GHz (3 THz). This approach creates a silicon structure (or other applicable choice of material) that provides mechanical force for probing while supporting the transfer of the high frequency energy between a measurement system and the integrated circuit, individual device or material.
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