发明公开
- 专利标题： Loopback-based built-in-self-test
- 专利标题（中）： Eingebauter Selbsttest aufPrüfschleifenbasis
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申请号： EP12306371.1申请日： 2012-11-07
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公开(公告)号： EP2731280A1公开(公告)日： 2014-05-14
- 发明人: Dhayni, Achraf , Arnal, Christophe
- 申请人： ST-Ericsson SA
- 申请人地址： Chemin du Champ-des-Filles 39 1228 Plan-les-Ouates CH
- 专利权人： ST-Ericsson SA
- 当前专利权人： ST-Ericsson SA
- 当前专利权人地址： Chemin du Champ-des-Filles 39 1228 Plan-les-Ouates CH
- 代理机构： Cabinet Plasseraud
- 主分类号： H04B17/00
- IPC分类号： H04B17/00 ; H04B17/02 ; H04L1/24
摘要：
A method of self-test for a near-field communication (NFC) radio frequency (RF) front-end unit comprising one antenna driver and at least one unit from a group comprising one reader and one card emulator, the RF front-end unit being connected to a digital front-end unit, wherein the antenna driver and the unit are interconnected through a first connection line via their respective first input-output interface and are also interconnected through a second connection line via their respective second input-output interface, the digital front-end unit being connected to the second connection line, the method comprising:
- activating the antenna driver and the unit based on control signals;
- generating a first signal onto the first connection line by modulating a respective first bitstream;
- retrieving a second bitstream from the second connection line, by demodulating the first signal; and,
- determining an outcome of the self-test by monitoring the demodulated signal.
- activating the antenna driver and the unit based on control signals;
- generating a first signal onto the first connection line by modulating a respective first bitstream;
- retrieving a second bitstream from the second connection line, by demodulating the first signal; and,
- determining an outcome of the self-test by monitoring the demodulated signal.
公开/授权文献
- EP2731280B8 Loopback-based built-in-self-test 公开/授权日：2019-03-20
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