发明公开
EP2824066A1 Reducing the effect of glass charging in mems devices
审中-公开
在MEMS-Vorrichtungen的Verringerung der Wirkung von Glasladung
- 专利标题: Reducing the effect of glass charging in mems devices
- 专利标题(中): 在MEMS-Vorrichtungen的Verringerung der Wirkung von Glasladung
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申请号: EP14173549.8申请日: 2014-06-23
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公开(公告)号: EP2824066A1公开(公告)日: 2015-01-14
- 发明人: Weber, Mark W. , Hanson, Timothy J.
- 申请人: Honeywell International Inc.
- 申请人地址: 101 Columbia Road P.O. Box 2245 Morristown, NJ 07962-2245 US
- 专利权人: Honeywell International Inc.
- 当前专利权人: Honeywell International Inc.
- 当前专利权人地址: 101 Columbia Road P.O. Box 2245 Morristown, NJ 07962-2245 US
- 代理机构: Houghton, Mark Phillip
- 优先权: US201313936938 20130708
- 主分类号: B81C1/00
- IPC分类号: B81C1/00
摘要:
A method of controlling exposed glass charging in a micro-electro-mechanical systems (MEMS) device is disclosed. The method includes providing a MEMS device comprising a proof mass (54) positioned apart from at least one sense plate (60) and at least one outboard metallization layer(64), wherein at least one conductive glass layer (62) is coupled to the sense plate and the outboard metallization layer, the conductive glass layer including at least one exposed glass portion (66) near the proof mass; and applying a first voltage to the sense plate and a second voltage to the outboard metallization layer. The first voltage is separated from the second voltage by a predetermined voltage level such that the exposed glass portion has an average voltage corresponding to a voltage midway between the first voltage and the second voltage.
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