发明公开
- 专利标题: SOURCE-DETECTOR ARRANGEMENT
- 专利标题(中): 源探测器安排
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申请号: EP15791642.0申请日: 2015-11-10
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公开(公告)号: EP3217879A1公开(公告)日: 2017-09-20
- 发明人: KOEHLER, Thomas , ROESSL, Ewald , BEHLING, Rolf Karl Otto , NOËL, Peter Benjamin Theodor , PFEIFFER, Franz
- 申请人: Koninklijke Philips N.V.
- 申请人地址: High Tech Campus 5 5656 AE Eindhoven NL
- 专利权人: Koninklijke Philips N.V.
- 当前专利权人: Koninklijke Philips N.V.
- 当前专利权人地址: High Tech Campus 5 5656 AE Eindhoven NL
- 代理机构: van Iersel, Hannie
- 优先权: EP14192623 20141111
- 国际公布: WO2016075140 20160519
- 主分类号: A61B6/00
- IPC分类号: A61B6/00 ; A61B6/03 ; H01J35/10 ; H01J35/14 ; G02B5/18
摘要:
The invention relates to a source-detector arrangement (11) of an X-ray apparatus (10) for grating based phase contrast computed tomography. The source-detector arrangement comprises an X-ray source (12) adapted for rotational movement around a rotation axis (R) relative to an object (140) and adapted for emittance of an X-ray beam of coherent or quasi-coherent radiation in a line pattern (21); and an X-ray detection system (16) including a first grating element (24) and a second grating element (26) and a detector element (6); wherein the line pattern of the radiation and a grating direction of the grating elements are arranged orthogonal to the rotation axis; and wherein the first grating element has a first grating pitch varied dependent on a cone angle (β) of the X-ray beam and/or the second grating element has a second grating pitch varied dependent on the cone angle of the X-ray beam.
公开/授权文献
- EP3217879B1 SOURCE-DETECTOR ARRANGEMENT 公开/授权日:2020-01-08
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