发明公开
EP3276575A1 METHOD, APPARATUS AND SYSTEM FOR RECONSTRUCTING IMAGES OF 3D SURFACE 审中-公开
用于重建3D表面的图像的方法,装置和系统

  • 专利标题: METHOD, APPARATUS AND SYSTEM FOR RECONSTRUCTING IMAGES OF 3D SURFACE
  • 专利标题(中): 用于重建3D表面的图像的方法,装置和系统
  • 申请号: EP17173576.4
    申请日: 2017-05-30
  • 公开(公告)号: EP3276575A1
    公开(公告)日: 2018-01-31
  • 发明人: ZHANG, LiWANG, SenCHEN, ZhiqiangXING, YuxiangJIN, Xin
  • 申请人: Nuctech Company Limited
  • 申请人地址: 2nd Floor, Block A TongFang Building, Shuangqinglu, Haidian District Beijing 100084 CN
  • 专利权人: Nuctech Company Limited
  • 当前专利权人: Nuctech Company Limited
  • 当前专利权人地址: 2nd Floor, Block A TongFang Building, Shuangqinglu, Haidian District Beijing 100084 CN
  • 代理机构: Isarpatent
  • 优先权: CN201610590192 20160725
  • 主分类号: G06T7/33
  • IPC分类号: G06T7/33
METHOD, APPARATUS AND SYSTEM FOR RECONSTRUCTING IMAGES OF 3D SURFACE
摘要:
The present disclosure discloses a method, an apparatus and a system for reconstructing an image of a three-dimensional surface. The method comprises the following steps of: constructing a three-dimensional model of the three-dimensional surface using X-ray imaging data obtained by imaging the three-dimensional surface with X-ray and extracting three-dimensional coordinate parameters of feature points; constructing one or more two-dimensional posture images of the three-dimensional surface using visible light imaging data obtained by imaging the three-dimensional surface with visible lights, and extracting two-dimensional coordinate parameters of feature points from each of the two-dimensional posture images; establishing a mapping relationship between the two-dimensional posture image and the three-dimensional model by matching the three-dimensional coordinate parameters and the two dimensional coordinate parameters of the feature points in each of the two-dimensional posture image; and filling the one or more two-dimensional posture image onto the three-dimensional model utilizing the mapping relationship established for each of the two dimensional posture images to form a reconstructed image of the three-dimensional surface, wherein the X-ray imaging data and the visible light imaging data of the three-dimensional surface along the same orientation are simultaneously captured.
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