CT IMAGING SYSTEM
    1.
    发明公开
    CT IMAGING SYSTEM 审中-实审

    公开(公告)号:EP4413925A1

    公开(公告)日:2024-08-14

    申请号:EP22877900.5

    申请日:2022-09-29

    IPC分类号: A61B6/00

    CPC分类号: A61B6/00 G01N23/046

    摘要: A CT imaging system (1000) is provided, including: a scanning channel (200) disposed in a first direction; a radiation source component (10) disposed on one side of the scanning channel (200), wherein the radiation source component (10) is used to emit radiation beams; a detector component (20) disposed on another side of the scanning channel (200), wherein the detector component (20) is disposed opposite to the radiation source component (10) and used to receive the radiation beams, and the radiation beams forms an imaging region between the radiation source component (10) and the detector component (20), wherein the detector component (20) includes at least two detection regions (21) and at least one blank region (22), the imaging region has a central cross-section of the radiation beams (31) extending through the radiation source component (10), and a position of the detection region (21) and a position of the blank region (22) are complementary with respect to the central cross-section of the radiation beams (31). The CT imaging system (1000) may obtain missing data through algorithm compensation, by means of rotational scanning and based on data symmetry, so as to obtain complete projection data to restore image information of an object to be inspected (100).

    INSPECTION SYSTEM AND METHOD
    2.
    发明公开

    公开(公告)号:EP4369057A1

    公开(公告)日:2024-05-15

    申请号:EP22836956.7

    申请日:2022-07-06

    IPC分类号: G01V5/00

    摘要: An inspection system, including: a ray source (100) rotatable between at least two scanning positions around a rotation axis, where a rotation angle of the ray source (100) between two adjacent scanning positions is greater than an angle of adjacent target spots of the ray source (100) relative to the rotation axis; a detector assembly (200); and a conveying device (300) for carrying an object to be inspected (10). The ray source (100) and the detector assembly (200) are movable in a traveling direction relative to the conveying device (300) so that the object to be inspected (10) enters an inspection region. When the ray source (100) is located at one of the plurality of scanning positions, the ray source (100) and the detector assembly (200) move in the traveling direction relative to the conveying device (300) and the ray source (100) emits X-rays; and when the ray source (100) and the detector assembly (200) move a predetermined distance in the traveling direction relative to the conveying device (300), the ray source (100) rotates around the rotation axis to another one of the plurality of scanning positions.

    RAY SCANNING DEVICE
    3.
    发明公开
    RAY SCANNING DEVICE 审中-实审

    公开(公告)号:EP4369055A1

    公开(公告)日:2024-05-15

    申请号:EP22836830.4

    申请日:2022-07-01

    IPC分类号: G01V5/00

    摘要: A ray scanning device, comprising: a conveying apparatus (1), conveying an object to be detected (6) to pass through a scanning region of the ray scanning device; a ray source (3), comprising multiple ray source modules (31, 32, 33, 34), each ray source module (31, 32, 33, 34) comprising at least one ray source point emitting a ray beam, and the multiple ray source modules (31, 32, 33, 34) being arranged around the scanning region above the conveying device (1) and secured in a plane perpendicular to a conveying direction of the object to be detected (6); and a detector (4), used to detect rays transmitted through the object to be detected (6) during a scanning period, and comprising multiple detector sets (41, 42, 43, 44), end portions of the multiple detector sets (41, 42, 43, 44) being connected to each other so as to surround the scanning region, and the multiple detector sets (41, 42, 43, 44) being secured in a plane perpendicular to the conveying direction of the object to be detected (6), the detector (4) being located between the ray source (3) and the scanning region along a direction perpendicular to the conveying direction of the object to be detected (6), the ray source (3) and the detectors (4) being arranged to at least partially overlap along the conveying direction of the object to be detected (6), and the multiple ray source modules (31, 32, 33, 34) being detached and mounted independently of each other.

    INSPECTION SYSTEM AND METHOD
    4.
    发明公开

    公开(公告)号:EP4345509A1

    公开(公告)日:2024-04-03

    申请号:EP22836960.9

    申请日:2022-07-06

    IPC分类号: G01V5/00

    摘要: An inspection system, including: a carrying device (300), at least one ray source (100), where each ray source (100) includes a separate housing (110) to define a vacuum space and a plurality of target spots (120) enclosed within the housing (110); and a detector assembly (200). The at least one ray source (100) and the detector assembly (200) are lifted or lowered along a central axis of the carrying device (300) relative to the carrying device (300). When viewed along the central axis, the at least one ray source (100) is translatable between a plurality of scanning positions relative to the carrying device (300). When the at least one ray source (100) is at one of the scanning positions relative to the carrying device (300), the at least one ray source (100) and the detector assembly (200) are lifted or lowered relative to the carrying device (300) along the central axis, and the at least one ray source (100) emits X-rays; and when the at least one ray source (100) and the detector assembly (200) are lifted or lowered a predetermined distance relative to the carrying device, the at least one ray source (100) translates to another one of the scanning positions relative to the carrying device (300).

    SCANNING IMAGING SYSTEM FOR SECURITY INSPECTION OF AN OBJECT AND IMAGING METHOD THEREOF

    公开(公告)号:EP3460531A1

    公开(公告)日:2019-03-27

    申请号:EP18178449.7

    申请日:2018-06-19

    IPC分类号: G01V5/00

    摘要: A scanning imaging system for security inspection of an object and an imaging method thereof are disclosed, the system comprising: a conveying unit (101) configured for bringing the object to move along a conveying direction; a plurality of radiographic sources (102) at one side of the conveying unit, being arranged successively in a direction vertical to a plane, in which the conveying unit is located, configured for alternately emitting ray beams to form a scanning area; a linear detector array (103) at the other side of the conveying unit, being configured for detecting first projection images, which are formed after the ray beams emitted by the plurality of radiographic sources penetrate through the object, in the process of the object passing through the scanning area; an imaging unit configured for obtaining a first reconstructed image of the object based on the first projection images of the plurality of radiographic sources.

    METHOD, APPARATUS AND SYSTEM FOR RECONSTRUCTING IMAGES OF 3D SURFACE
    6.
    发明公开
    METHOD, APPARATUS AND SYSTEM FOR RECONSTRUCTING IMAGES OF 3D SURFACE 审中-公开
    用于重建3D表面的图像的方法,装置和系统

    公开(公告)号:EP3276575A1

    公开(公告)日:2018-01-31

    申请号:EP17173576.4

    申请日:2017-05-30

    IPC分类号: G06T7/33

    摘要: The present disclosure discloses a method, an apparatus and a system for reconstructing an image of a three-dimensional surface. The method comprises the following steps of: constructing a three-dimensional model of the three-dimensional surface using X-ray imaging data obtained by imaging the three-dimensional surface with X-ray and extracting three-dimensional coordinate parameters of feature points; constructing one or more two-dimensional posture images of the three-dimensional surface using visible light imaging data obtained by imaging the three-dimensional surface with visible lights, and extracting two-dimensional coordinate parameters of feature points from each of the two-dimensional posture images; establishing a mapping relationship between the two-dimensional posture image and the three-dimensional model by matching the three-dimensional coordinate parameters and the two dimensional coordinate parameters of the feature points in each of the two-dimensional posture image; and filling the one or more two-dimensional posture image onto the three-dimensional model utilizing the mapping relationship established for each of the two dimensional posture images to form a reconstructed image of the three-dimensional surface, wherein the X-ray imaging data and the visible light imaging data of the three-dimensional surface along the same orientation are simultaneously captured.

    摘要翻译: 本公开公开了用于重建三维表面的图像的方法,设备和系统。 该方法包括以下步骤:使用通过用X射线对三维表面进行成像获得的X射线成像数据并提取特征点的三维坐标参数来构建三维表面的三维模型; 使用通过用可见光对三维表面进行成像获得的可见光成像数据来构造三维表面的一个或多个二维姿态图像,并且从二维姿态中的每一个提取特征点的二维坐标参数 图片; 通过匹配二维姿势图像中的每一个中的特征点的三维坐标参数和二维坐标参数,建立二维姿势图像和三维模型之间的映射关系; 以及利用为每个二维姿势图像建立的映射关系将一个或多个二维姿势图像填充到三维模型上以形成三维表面的重建图像,其中X射线成像数据和 同时捕捉沿着相同取向的三维表面的可见光成像数据。

    X-RAY DIFFRACTION DETECTION SYSTEM AND METHOD
    7.
    发明公开
    X-RAY DIFFRACTION DETECTION SYSTEM AND METHOD 审中-公开
    X射线衍射检测系统和方法

    公开(公告)号:EP3182175A1

    公开(公告)日:2017-06-21

    申请号:EP16185335.3

    申请日:2016-08-23

    IPC分类号: G01V5/00 G01N23/20

    摘要: The present disclosure relates to a detection system and method. The detection system includes: a distributed radiation source (101) having a plurality of radiation source focus points, which emit rays to irradiate an object under detection, wherein the plurality of radiation source focus points are divided into a certain number of groups; a primary collimator (102) that limits rays of each of the radiation source focus points such that the rays emit into an XRD detection device; the XRD detection device (103) including a plurality of XRD detectors that are divided into the same number of groups as the radiation source focus points, wherein XRD detectors in a same group are arranged to be separated by XRD detectors in other groups, and rays of each of the radiation source focus points are merely received by XRD detectors having the same group number as the group number of the radiation source focus point.

    摘要翻译: 本公开涉及检测系统和方法。 该检测系统包括:具有多个辐射源焦点的分布式辐射源(101),其发射用于照射被检测物体的光线,其中多个辐射源焦点被分成一定数量的组; 主要准直器(102),其限制每个辐射源焦点的射线,使得射线发射到XRD检测装置中; 所述XRD检测装置(103)包括被分成与所述辐射源焦点相同数量的组的多个XRD检测器,其中同一组中的XRD检测器被布置成通过其他组中的XRD检测器分离,并且射线 仅由具有与辐射源焦点的组编号相同的组编号的XRD检测器接收每个辐射源焦点。

    DUAL-SOURCE SECURITY INSPECTION CT SCANNING SYSTEM AND SCANNING METHOD
    8.
    发明公开
    DUAL-SOURCE SECURITY INSPECTION CT SCANNING SYSTEM AND SCANNING METHOD 审中-公开
    CT-SYSTEM麻省理工学士学位论文ÜE E E E E E E E E E E E E E

    公开(公告)号:EP3037848A1

    公开(公告)日:2016-06-29

    申请号:EP15202529.2

    申请日:2015-12-23

    IPC分类号: G01V5/00

    摘要: The present disclosure provides a dual-source security inspection CT scanning system and scanning method. The system includes two sets of scan imaging systems (6, 7), wherein each set of the scan imaging systems (6, 7) has its own separate ray source (6-1, 7-1) and detector (6-2, 7-2), the two sets of scan imaging systems (6, 7) are juxtaposed on a same rotary mechanism (2), and a predetermined interval is provided between imaging planes of the two sets of scan imaging systems (6, 7). The present disclosure ensures the two sets of imaging optical paths do not interfere with each other, therefore effectively avoiding the problem of scattering mutual interference between the dual sources of the dual-source CT scanning system in the prior art.

    摘要翻译: 本公开提供了一种双源安全检查CT扫描系统和扫描方法。 该系统包括两组扫描成像系统(6,7),其中每组扫描成像系统(6,7)具有其自己的独立射线源(6-1,7-1)和检测器(6-2) 如图7-2所示,两组扫描成像系统(6,7)并置在相同的旋转机构(2)上,并且在两组扫描成像系统(6,7)的成像平面之间设置预定间隔, 。 本公开确保了两组成像光路不彼此干涉,因此有效地避免了现有技术中双源CT扫描系统的双重源之间散射相互干扰的问题。

    INSPECTION DEVICE FOR SCANNING AND INSPECTING OBJECT BEING INSPECTED

    公开(公告)号:EP4414695A1

    公开(公告)日:2024-08-14

    申请号:EP22877901.3

    申请日:2022-09-29

    IPC分类号: G01N23/046 G01N23/02

    摘要: An inspection device used for scanning and inspecting an object to be inspected (2), includes: an inspection channel (1), where the object to be inspected (2) enters and exits the inspection device through the inspection channel (1); an imaging system (6) used to scan and inspect the object to be inspected (2), where the imaging system (6) includes a radiation source (6S) used to generate a ray, where the radiation source (6S) is disposed on one side of the inspection channel (1), and the ray at least forms a main beam surface (61) applicable to scan and inspect the object to be inspected (2); and a detector (6T) used to receive the ray passing through the object to be inspected (2), where the detector (6T) is disposed on the other side of the inspection channel (1) to form an inspection region (63) between the radiation source (6S) and the detector (6T); and a posture adjustment structure (4) disposed in the inspection region (63) and used to adjust a posture of the object to be inspected (2) located in the inspection region (63). The object to be inspected (2) has an inspection surface (21). The posture adjustment structure (4) may adjust the posture of the object to be inspected (2), so that the inspection surface (21) and the main beam surface (61) are in the same plane.

    CHECK SYSTEM AND METHOD
    10.
    发明公开

    公开(公告)号:EP4369056A1

    公开(公告)日:2024-05-15

    申请号:EP22836955.9

    申请日:2022-07-06

    IPC分类号: G01V5/00

    摘要: Provided are an inspection method, and an inspection system including: at least one ray source (100); a detector assembly (200) and a conveying device (300) for carrying a to-be-inspected object (10). At least one ray source (100) and the detector assembly (200) may move in a traveling direction relative to the conveying device (300), so that the to-be-inspected object (10) may enter an inspection region (30). When viewed along a central axis (AX) of the inspection region (30), at least one ray source (100) may translate between scanning positions, and a translation distance of at least one ray source (100) between two adjacent scanning positions is greater than a spacing between adjacent target spots (120) of each ray source (100). When at least one ray source (100) is located at one scanning position, at least one ray source (100) and the detector assembly (200) move in the traveling direction relative to the conveying device (300) and at least one ray source (100) emits X-rays. After moving a predetermined distance, at least one ray source (100) translates to another scanning position.