- 专利标题: APPARATUS AND METHOD FOR TESTING A CIRCUIT
-
申请号: EP17717186.5申请日: 2017-04-13
-
公开(公告)号: EP3427074A1公开(公告)日: 2019-01-16
- 发明人: GERTH, Stephan , EINWICH, Karsten , MARKWIRTH, Thomas
- 申请人: Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V.
- 申请人地址: Hansastraße 27c 80686 München DE
- 专利权人: Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V.
- 当前专利权人: Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V.
- 当前专利权人地址: Hansastraße 27c 80686 München DE
- 代理机构: Schairer, Oliver
- 优先权: EP16165674 20160415; EP16183057 20160805
- 国际公布: WO2017178617 20171019
- 主分类号: G01R31/3183
- IPC分类号: G01R31/3183 ; G06F17/50
摘要:
The invention refers to an apparatus (1) for testing a circuit (2), comprising: an interrupter (12) configured for interrupting based on a circuit model (11) describing at least a part of the circuit (2) a connection (22) between two components (20, 21) of the circuit (2), wherein the circuit model (11) describes the two components (20, 21) connected by the connection (22), an inserter (13) configured for inserting based on the circuit model (11) a test element model (14) into the interrupted connection (22), and an evaluator (15) configured for evaluating based on the circuit model (11) and the test element model (14) a response of the circuit model (11) to the inserted test element model (14). The invention also refers to a corresponding method.
公开/授权文献
- EP3427074B1 APPARATUS AND METHOD FOR TESTING A CIRCUIT 公开/授权日:2020-02-05
信息查询
IPC分类: