- 专利标题: STRUCTURE FOR DETECTING TEMPERATURE OF ELECTRONIC DEVICE
-
申请号: EP21200268.7申请日: 2018-07-18
-
公开(公告)号: EP3951340A1公开(公告)日: 2022-02-09
- 发明人: JU, Wanjae , NA, Hyoseok , PARK, Chanho
- 申请人: Samsung Electronics Co., Ltd.
- 申请人地址: KR Gyeonggi-do 16677 129, Samsung-ro, Yeongtong-gu, Suwon-si,
- 代理机构: Arnold & Siedsma
- 优先权: KR20170091170 20170718
- 主分类号: G01K1/14
- IPC分类号: G01K1/14 ; G01K1/16 ; G01K7/22 ; G06F1/16 ; G06F1/20 ; H05K1/18 ; H05K3/36 ; H01M10/42 ; H01M10/48
摘要:
The present application concerns an electronic device comprising a housing including a rear housing forming an external shape of the electronic device, a first board disposed in a first direction from the rear housing of the housing, wherein at least one processor is mounted at the first board, a second board disposed between the rear housing and the first board and electrically connected with the first board, the second board being spatially separated from the rear housing, a thermistor mounted on the second board, wherein the thermistor is disposed at a surface of the second board in a second direction that is towards the rear housing, the second direction being opposite to the first direction, and at least one first structure for securing a disposition space in which the thermistor is disposed, wherein the disposition space is configured to block heat generated at adjacent other spaces of the electronic device, wherein the at least one first structure is configured to support a pressure in the first direction and/or the second direction to prevent a physical impact and/or to block heat transferred from the outside to the disposition space, and wherein the at least one processor is configured to determine, based on an electrical signal from the thermistor, a temperature of the rear housing detected by the thermistor.
公开/授权文献
- EP3951340B1 STRUCTURE FOR DETECTING TEMPERATURE OF ELECTRONIC DEVICE 公开/授权日:2022-10-19
信息查询