- 专利标题: APPARATUS AND METHOD FOR DETERMINING MOUNTING INFORMATION
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申请号: EP21169281.9申请日: 2021-04-20
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公开(公告)号: EP3993591A1公开(公告)日: 2022-05-04
- 发明人: LEE, Duk Young , LEE, Jae Hwan , TAK, Jin Hyung , PARK, Chan Woo , HAN, Guk
- 申请人: Koh Young Technology Inc.
- 申请人地址: KR Seoul 08588 14F, 53, Gasan digital 2-ro Geumcheon-gu
- 代理机构: M. Zardi & Co S.A.
- 优先权: KR20200145098 20201103
- 主分类号: H05K13/04
- IPC分类号: H05K13/04 ; H05K13/08
摘要:
The present disclosure provides an apparatus for determining mounting information. The apparatus according to the present disclosure may be configured to acquire solder measurement information indicating a state of a solder printed on a first substrate, determine whether or not the state of the solder is changed from states of solders printed on second substrates, which are measured prior to measurement of the first substrate, based on the solder measurement information, upon the determination that the state of the solder is not changed, determine mounting information indicating a mounting condition for mounting a first component on the first substrate using one or more models, and deliver the mounting information to a mounter. The one or more models may be configured to output the mounting information based on a correlation between states of a second component before and after a reflow process for each of the second substrates.
公开/授权文献
- EP3993591B1 APPARATUS AND METHOD FOR DETERMINING MOUNTING INFORMATION 公开/授权日:2023-06-07
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