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公开(公告)号：EP4492438A2
公开(公告)日：2025-01-15
申请号：EP24215317.9
申请日：2020-06-29
Applicant: Koh Young Technology Inc.
Inventor： LEE, Chan Kwon , JEON, Moon Young , HONG, Deok Hwa , JEONG, Joong Ki
IPC: H01L21/66
Abstract: The present disclosure proposes an apparatus 1400 for determining a first three-dimensional shape of an object located on a reference plane, comprising: a first light source 1410 configured to irradiate one or more first pattern lights to the object; one or more first image sensors 1420 configured to capture one or more first reflected lights generated by reflecting the one or more first pattern lights from the object; a second light source 1430 configured to sequentially irradiate one or more second pattern lights having one phase range; a first iris 1452 configured to pass the one or more second pattern lights irradiated from the second light source 1430 toward a beam splitter 1440; the beam splitter 1440 and one or more lenses 1450 configured to change optical paths of the one or more second pattern lights passing through the first iris 1452 so that a beam of light corresponding to a respective phase of the phase range spreads, and arrives at each point of a partial region of an upper surface of the object; a second iris 1472 configured to pass one or more second reflected lights, generated by the reflection of the one or more second pattern lights from the partial region, toward a second image sensor 1460; the second image sensor 1460 configured to capture the one or more second reflected lights passing through the second iris 1472; and a processor 1510 that is electrically connected to the first light source 1410, the one or more first image sensors 1420, the second light source 1430 and the second image sensor 1460, and that is configured to determine the first three-dimensional shape of the object based on the one or more first reflected lights and the one or more second reflected lights, and wherein each of the one or more second pattern lights is a pattern light generated by phase-shifting a pattern light having a pattern in the first direction or the second direction by an integer multiple of a preset phase interval. The present disclosure further discloses a corresponding method.
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公开(公告)号：EP4488622A2
公开(公告)日：2025-01-08
申请号：EP24215144.7
申请日：2020-06-29
Applicant: Koh Young Technology Inc
Inventor： LEE, Chan Kwon , JEON, Moon Young , HONG, Deok Hwa , JEONG, Joong Ki
IPC: G01B11/30
Abstract: The present disclosure proposes an apparatus for determining a first three-dimensional shape of an object located on a reference plane, comprising: one or more first light sources configured to irradiate one or more first pattern lights to the object; a second light source configured to sequentially irradiate one or more second pattern lights having one phase range;
a first iris configured to pass the one or more second pattern lights irradiated from the second light source toward a beam splitter; the beam splitter and one or more lenses configured to change optical paths of the one or more second pattern lights passing through the first iris so that a beam of light corresponding to a respective phase of the phase range spreads, and arrives at each point of a partial region of an upper surface of the object; a second iris configured to pass one or more second reflected lights, generated by the reflection of the one or more second pattern lights from the partial region, toward an image sensor; the image sensor configured to capture one or more first reflected lights generated by reflecting the one or more first pattern lights from the object and the one or more second reflected lights passing through the second iris; and a processor that is electrically connected to the one or more first light sources, the second light source and the image sensor, and that is configured to determine the first three-dimensional shape of the object based on the one or more first reflected lights and the one or more second reflected lights, and wherein each of the one or more second pattern lights is a pattern light generated by phase-shifting a pattern light having a pattern in a first direction or a second direction perpendicular to the first direction by an integer multiple of a preset phase interval.-
公开(公告)号：EP4235093A3
公开(公告)日：2023-11-01
申请号：EP23185802.8
申请日：2019-05-20
Applicant: Koh Young Technology Inc.
Inventor： HONG, Young Joo , CHOI, Jeong Hun , HONG, Deok Hwa
IPC: G01B9/02 , G01B9/02055 , G01B9/02091
Abstract: The present disclosure relates to a method of correcting a three-dimensional image. To correct an image distorted by coherence gate curvature (CGC) occurring by an optical system, the method generates a three-dimensional image of a sample holder on which an object to be measured is placed from an interference signal, generates a CGC profile on the basis of an image of a cover glass of the sample holder appearing in the three-dimensional image, generates a CGC fitting curve from the CGC profile, and corrects the interference signal by using the CGC fitting curve. The present disclosure also relates to an OCT system capable of performing a method of correcting a three-dimensional image.
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公开(公告)号：EP4068137A1
公开(公告)日：2022-10-05
申请号：EP21812422.0
申请日：2021-05-31
Applicant: Koh Young Technology Inc.
Inventor： HAN, Guk , LEE, Jae Hwan , LEE, Duk Young , PARK, Chan Woo
IPC: G06F30/20 , G06F119/22 , G06F115/12
Abstract: An electronic apparatus according to various embodiments of the present disclosure may include: a communication circuit that is communicatively connected to a solder printing apparatus and a measurement apparatus; one or more memories; and one or more processors. One or more processors may be configured to: acquire a first control parameter set of the solder printing apparatus for printing solder on a first substrate; transmit information indicating the first control parameter set to the solder printing apparatus; acquire first solder measurement information indicating a state of the solder printed on the first substrate; determine a first yield for the first substrate based on the first solder measurement information; and generate a model for searching for an optimal control parameter set based on a first data pair including the first control parameter set and the first yield.
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5.发明公开
公开(公告)号：EP3993593A1
公开(公告)日：2022-05-04
申请号：EP21163897.8
申请日：2021-03-22
Applicant: Koh Young Technology Inc.
Inventor： LEE, Duk Young , LEE, Jun Ho , LEE, Jae Hwan
IPC: H05K13/08
Abstract: The apparatus according to various embodiments includes one or more processors, and one or more memories operatively connected to the one or more processors. The one or more memories may store instructions that, when executed, cause the one or more processors to acquire a plurality of first position offsets of a plurality of first components respectively mounted on a plurality of first substrates with respect to a plurality of pads of the plurality of first substrates corresponding to the plurality of first components from the optical measurement device, set a range of a normal state for a component position offset based on the plurality of first position offsets, generate a control signal for adjusting at least one control parameter of the component mounting device associated with a component mounting position based on the range of the normal state, and transmit the control signal to the component mounting device.
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Patent Agency Ranking
公开(公告)号：EP3992575A1
公开(公告)日：2022-05-04
申请号：EP20832687.6
申请日：2020-06-29
Applicant: Koh Young Technology Inc.
Inventor： LEE, Chan Kwon , JEON, Moon Young , HONG, Deok Hwa , JEONG, Joong Ki
Abstract: The present disclosure proposes an apparatus for determining a first three-dimensional shape of an object. The apparatus according to the present disclosure includes one or more first light sources configured to irradiate one or more first pattern lights to the object, a second light source configured to sequentially irradiate one or more second pattern lights having one phase range, a beam splitter and one or more lenses configured to change optical paths of the one or more second pattern lights so that the lights corresponding to respective phases of the phase range reach a partial area of an upper surface of the object in a dispersed manner, an image sensor configured to capture one or more first reflected lights generated by reflecting the one or more first pattern lights from the object and one or more second reflected lights generated by reflecting the one or more second pattern lights from the partial area, and a processor electrically connected to the one or more first light sources, the second light source and the image sensor. The processor may determine the first three-dimensional shape of the object based on the one or more first reflected lights and the one or more second reflected lights.
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公开(公告)号：EP3925529A1
公开(公告)日：2021-12-22
申请号：EP20756471.7
申请日：2020-02-11
Applicant: Koh Young Technology Inc.
Inventor： KIM, Hong Ki , HONG, Young Joo , HONG, Deok Hwa , LIM, Guk Bin , KIM, Seung Tae , KIM, Min Kyu , JO, Eun Ha
Abstract: A blood flow measurement device according to various embodiments may be configured to irradiate light to a first position of a subject and a second position of the subject located in a first direction with respect to the first position, acquire intensities of the reflected light at the first position and the second position, determine a first value which is a difference between the intensities of the reflected light at the first position and the second position, irradiate light to a third position of the subject located in a second direction with respect to the second position, acquire an intensity of the reflected light at the third position, determine a second value which is a difference between the intensities of the reflected light at the second position and the third position, and determine a blood flow direction based on the first value and the second value.
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公开(公告)号：EP3889590A3
公开(公告)日：2021-11-10
申请号：EP21170906.8
申请日：2014-04-01
Applicant: Koh Young Technology Inc.
Inventor： LEE, Hyun-Seok , YANG, Jae-Sik , KIM, Ja-Geun , KIM, Hee-Tae , YOU, Hee-Wook
IPC: G01N21/88 , G01N21/94 , G01B11/25 , G06T7/00 , G01N21/956
Abstract: In order to inspect a substrate, an image information of a substrate before applying solder is displayed. Then, at least one inspection region on the substrate is image-captured to obtain an image of the inspection region that is image-captured. Then, image information that is to be displayed is renewed and the renewed image information is displayed. And, in order to inspect a foreign substance, obtained image of the inspection region is compared with a reference image of the substrate. Therefore, an operator can easily catch a region corresponding to a specific region of the image that is displayed, and easily detect a foreign substance on the substrate.
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9.发明公开
公开(公告)号：EP3736560A1
公开(公告)日：2020-11-11
申请号：EP20734314.6
申请日：2020-01-21
Inventor： KIM, Jong Hwan , PARK, Juyoun , HWANG, Ye Won , PARK,Jin Man , LEE, Seung Jae , CHOI, Tae Min , YOO, Yong Ho , LEE, Duk Young
Abstract: A substrate inspection apparatus generates, when anomalies of a plurality of second solder pastes among a plurality of first solder pastes printed on a first substrate is detected, at least one image indicating a plurality of second solder pastes with anomalies detected by using an image about a first substrate, applies the at least one image to a machine-learning-based model, acquires a plurality of first values indicating relevance of respective first fault types to the at least one image and a plurality of first images indicating regions associated with one of a plurality of first fault types, determines a plurality of second fault types, which are associated with the plurality of second solder pastes by using the plurality of first values and the plurality of first images, and determines at least one third solder paste, which is associated with the respective second fault types.
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公开(公告)号：EP3181085B1
公开(公告)日：2020-09-16
申请号：EP15832127.3
申请日：2015-08-11
Applicant: Koh Young Technology Inc. , Kyungpook National University Industry-Academic Cooperation Foundation
Inventor： LEE, Hyun Ki , OH, Hyun Min , KIM, Min Young
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