- 专利标题: METHOD FOR ANALYZING TEST SUBSTANCE, ANALYZER, TRAINING METHOD, ANALYZER SYSTEM, AND ANALYSIS PROGRAM
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申请号: EP22160175.0申请日: 2022-03-04
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公开(公告)号: EP4053842A1公开(公告)日: 2022-09-07
- 发明人: Okada, Masaya , Shimaoka, Yuki , Iwanaga, Shigeki , Bando, Kazuki , Fujita, Katsumasa , Nawa, Yasunori , Fujita, Satoshi
- 申请人: SYSMEX CORPORATION , OSAKA UNIVERSITY , National Institute Of Advanced Industrial Science and Technology
- 申请人地址: JP Kobe-shi Hyogo 651-0073 5-1 Wakinohama-Kaigandori 1-chome Chuo-ku; JP Suita-shi Osaka 565-0871 1-1, Yamadaoka; JP Chiyoda-ku Tokyo 100-8921 3-1 Kasumigaseki 1-chome
- 代理机构: Hoffmann Eitle
- 优先权: JP2021035593 20210305
- 主分类号: G16C20/20
- IPC分类号: G16C20/20
摘要:
Disclosed is an analytical method for analyzing a test substance contained in a measurement sample, the method comprising: generating a data set based on a plurality of optical spectra acquired from a plurality of locations in the measurement sample; inputting the data set into a deep learning algorithm having a neural network structure; and outputting information on the test substance, on the basis of an analytical result from the deep learning algorithm.
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