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1.
公开(公告)号:EP4053842A1
公开(公告)日:2022-09-07
申请号:EP22160175.0
申请日:2022-03-04
申请人: SYSMEX CORPORATION , OSAKA UNIVERSITY , National Institute Of Advanced Industrial Science and Technology
发明人: Okada, Masaya , Shimaoka, Yuki , Iwanaga, Shigeki , Bando, Kazuki , Fujita, Katsumasa , Nawa, Yasunori , Fujita, Satoshi
IPC分类号: G16C20/20
摘要: Disclosed is an analytical method for analyzing a test substance contained in a measurement sample, the method comprising: generating a data set based on a plurality of optical spectra acquired from a plurality of locations in the measurement sample; inputting the data set into a deep learning algorithm having a neural network structure; and outputting information on the test substance, on the basis of an analytical result from the deep learning algorithm.
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公开(公告)号:EP4053556A1
公开(公告)日:2022-09-07
申请号:EP22160173.5
申请日:2022-03-04
申请人: SYSMEX CORPORATION , OSAKA UNIVERSITY , National Institute Of Advanced Industrial Science and Technology
发明人: Shimaoka, Yuki , Okada, Masaya , Iwanaga, Shigeki , Bando, Kazuki , Fujita, Katsumasa , Nawa, Yasunori , Fujita, Satoshi
IPC分类号: G01N33/543
摘要: Disclosed is a preparation method for preparing a measurement sample comprising an aggregate of metal nanoparticles having an analyte bound thereto, the preparation method comprising: contacting the analyte with a linker to bind the analyte to the linker; and contacting the linker that has been bound to the analyte with the metal nanoparticles to bind the linker to the metal nanoparticles.
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