Disclosed are a conductive film (100) and a test component (10). A conductive film (100) includes a supporting layer (110), a circuit layer (CL) and a protective layer (150). The supporting layer (110) has a first surface (111) and a second surface (112) opposite to the first surface (111). The supporting layer (110) supports the circuit layer (CL). The circuit layer (CL) includes a first protruding part (120), a second protruding part (130) and a connecting part (140). The first protruding part (120) is disposed on the first surface (111). The second protruding part (130) is disposed on the second surface (112). The connecting part (140) is disposed between the first protruding part (120) and the second protruding part (130). The first protruding part (120) is connected to the second protruding part (130) through the connecting part (140). The protective layer (150) covers the first protruding part (120). The conductive film (100) and the test component (10) of the disclosed embodiments may have a buffering effect or increase the service life.