- 专利标题: THERMAL IMAGING WITH SCANNING AT SUB-PIXEL LEVELS
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申请号: EP23205694.5申请日: 2023-10-25
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公开(公告)号: EP4361586A1公开(公告)日: 2024-05-01
- 发明人: Gilton, Terry L. , de Wit, Gabrielle
- 申请人: Calumino Pty Ltd
- 申请人地址: AU Eveleigh, NSW 2015 Suite 145 4 Cornwallis St National Innovation Centre
- 专利权人: Calumino Pty Ltd
- 当前专利权人: Calumino Pty Ltd
- 当前专利权人地址: AU Eveleigh, NSW 2015 Suite 145 4 Cornwallis St National Innovation Centre
- 代理机构: Penza, Giancarlo
- 优先权: US 202217974149 2022.10.26
- 主分类号: G01J5/00
- IPC分类号: G01J5/00 ; G01J5/0831 ; G01J5/0803 ; G01J5/08 ; G01J5/40 ; G01J5/10 ; G01J5/0806 ; H04N5/33
摘要:
It is disclosed a thermal imaging device having a scan mechanism operable to effectuate sequentially predetermined offsets, each configured between a thermal image of thermal radiations in a defined area on an imaging plane and an array of micro mirrors configured on a substrate. A respective image of a light pattern of a light beam reflected by a light reflection portion of each respective micro mirror in the array can be captured, when a rotation of the respective micro mirror, caused by radiation incident on a radiation absorption surface of the respective micro mirror, is stabilized at a respective offset. After computing a respective measurement of intensity measured by the respective micro mirror based on the respective image captured for the respective offset, a processor computes measurements of intensity of radiation in sub-areas of the thermal image, from measurements of intensity for the predetermined offsets, to generate a high resolution output.
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