Invention Grant
- Patent Title: Apparatus and methods for determining a pass/fail condition of a memory device
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Application No.: US15084943Application Date: 2016-03-30
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Publication No.: US10014062B2Publication Date: 2018-07-03
- Inventor: Violante Moschiano , Giovanni Santin
- Applicant: MICRON TECHNOLOGY, INC.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dicke, Billig & Czaja, PLLC
- Main IPC: G11C16/34
- IPC: G11C16/34 ; G11C11/56 ; G11C16/06 ; G11C16/24 ; G11C16/10 ; G11C16/00 ; G11C29/04

Abstract:
Memory devices including an array of memory cells, a first buffer selectively connected to the array of memory cells and corresponding to a particular bit rank of a byte of information of a programming operation of the memory device, and a second buffer selectively connected to the array of memory cells and corresponding to the particular bit rank of a different byte of information of the programming operation of the memory device, wherein an output of the first buffer and an output of the second buffer are connected in parallel to a common line, as well as methods of their operation to indicate a pass/fail condition of the programming operation.
Public/Granted literature
- US20160211034A1 APPARATUS AND METHODS FOR DETERMINING A PASS/FAIL CONDITION OF A MEMORY DEVICE Public/Granted day:2016-07-21
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