Invention Grant
- Patent Title: SiC substrate treatment method
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Application No.: US15527602Application Date: 2015-11-17
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Publication No.: US10014176B2Publication Date: 2018-07-03
- Inventor: Norihito Yabuki , Satoshi Torimi , Satoru Nogami
- Applicant: Toyo Tanso Co., Ltd.
- Applicant Address: JP Osaka-shi
- Assignee: TOYO TANSO CO., LTD.
- Current Assignee: TOYO TANSO CO., LTD.
- Current Assignee Address: JP Osaka-shi
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: JP2014-233233 20141118
- International Application: PCT/JP2015/005739 WO 20151117
- International Announcement: WO2016/079980 WO 20160526
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L21/04 ; H01L21/306

Abstract:
Provided is a SiC substrate treatment method for, with respect to a SiC substrate (40) that has, on its surface, grooves (41), activating ions while preventing roughening of the surface of the substrate. In the method, an ion activation treatment in which the SiC substrate (40) is heated under Si vapor pressure is performed to the SiC substrate (40) has, on its surface, an ion implantation region (46) in which ions have been implanted, and has the grooves (41) provided in a region including at least the ion implantation region (46), thereby ions that are implanted in the SiC substrate (40) is activated while etching the surface of the substrate.
Public/Granted literature
- US20170323792A1 SiC SUBSTRATE TREATMENT METHOD Public/Granted day:2017-11-09
Information query
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