Invention Grant
- Patent Title: System and method for built-in self-test of electronic circuits
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Application No.: US15211782Application Date: 2016-07-15
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Publication No.: US10014899B2Publication Date: 2018-07-03
- Inventor: Robert Floyd Payne , Lambert Jacob Helleman
- Applicant: TEXAS INSTRUMENTS INCORPORATED
- Applicant Address: US TX Dallas
- Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee: TEXAS INSTRUMENTS INCORPORATED
- Current Assignee Address: US TX Dallas
- Agent Michael A. Davis, Jr.; Charles A. Brill; Frank D. Cimino
- Main IPC: H04B1/40
- IPC: H04B1/40 ; G01R31/28 ; H04B17/00 ; H04L7/02

Abstract:
In described examples of a device with built-in-self-test, a multiplexer has at least first and second input terminals and is coupled to receive a first input signal at the first input terminal, a second input signal at the second input terminal, and selection signals. Also, the multiplexer is coupled to output: the first input signal in response to a first combination of the selection signals; the second input signal in response to a second combination of the selection signals; and an analog summation of the first and second input signals in response to a third combination of the selection signals.
Public/Granted literature
- US20180019781A1 SYSTEM AND METHOD FOR BUILT-IN SELF-TEST OF ELECTRONIC CIRCUITS Public/Granted day:2018-01-18
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