- 专利标题: Combined surface inspection using multiple scanners
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申请号: US15347281申请日: 2016-11-09
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公开(公告)号: US10018570B2公开(公告)日: 2018-07-10
- 发明人: Luke C. Ingram , Anthony W. Baker , Steven A. Dorris , Christopher P. Bellavia
- 申请人: The Boeing Company
- 申请人地址: US IL Chicago
- 专利权人: The Boeing Company
- 当前专利权人: The Boeing Company
- 当前专利权人地址: US IL Chicago
- 代理机构: Kwan & Olynick LLP
- 主分类号: G01N21/00
- IPC分类号: G01N21/00 ; G01N21/88
摘要:
Provided are methods and systems for inspecting surfaces of various components, such as evaluating height deviations on these surfaces. A method involves aggregating inspection data from multiple line scanners into a combined data set. This combined data set represents a portion of the surface that is larger than the field of measurement any one of the scanners. Furthermore, each pair of adjacent scanners operate at different periods of time to avoid interference. Because operating periods are offset, surface portions scanned by the pair of adjacent scanners can overlap without interference. This overlap of the scanned portions ensures that the entire surface is analyzed. The position of scanners relative to the inspection surface may be changed in between the scans and, in some embodiments, even during the scan. This approach allows precise scanning of large surfaces.
公开/授权文献
- US20180128751A1 COMBINED SURFACE INSPECTION USING MULTIPLE SCANNERS 公开/授权日:2018-05-10
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