• Patent Title: Device, arrangement, and method for measuring a current intensity in a primary conductor through which current flows
  • Application No.: US15032103
    Application Date: 2014-10-29
  • Publication No.: US10018656B2
    Publication Date: 2018-07-10
  • Inventor: Bernhard OstrickCarsten Dehoff
  • Applicant: EPCOS AG
  • Applicant Address: DE München
  • Assignee: EPCOS AG
  • Current Assignee: EPCOS AG
  • Current Assignee Address: DE München
  • Agency: Slater Matsil, LLP
  • Priority: DE102013112628 20131115
  • International Application: PCT/EP2014/073247 WO 20141029
  • International Announcement: WO2015/071102 WO 20150521
  • Main IPC: G01R15/20
  • IPC: G01R15/20 G01R33/07 G01R19/00
Device, arrangement, and method for measuring a current intensity in a primary conductor through which current flows
Abstract:
A device, an arrangement, and a method for measuring a current intensity in a primary conductor through which current flows are disclosed. In an embodiment, an apparatus includes a magnetic field-generating element configured to generate a reference magnetic field; and a magnetic field angle-sensitive element configured to measure an orientation of a total magnetic field, the total magnetic field is produced by overlapping of the primary magnetic field and the reference magnetic field in space, wherein the primary magnetic field and the reference magnetic field are not parallel to one another at a location of the magnetic field angle-sensitive element, and wherein the current intensity of the current flowing through the primary conductor is determinable from the orientation of the total magnetic field in space.
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