Invention Grant
- Patent Title: Methods of detecting fast reuse memory blocks and memory block management methods using the same
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Application No.: US15429496Application Date: 2017-02-10
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Publication No.: US10048892B2Publication Date: 2018-08-14
- Inventor: Sang-kwon Moon , Jong-youl Lee , Seong-jun Ahn , Hee-won Lee
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Myers Bigel, P.A.
- Priority: KR10-2016-0068109 20160601
- Main IPC: G06F3/06
- IPC: G06F3/06

Abstract:
Fast reuse memory block detection methods and memory block management methods using the same are provided. A fast reuse memory block detection method may include selecting a memory block from memory blocks included in a nonvolatile memory device as a reference block at an initially set period, managing one of an erase time and a program time of the reference block, and determining whether other memory blocks are fast reuse memory blocks, based on a use period that is determined according to the managed one of the erase time and the program time of the reference block.
Public/Granted literature
- US20170351459A1 METHODS OF DETECTING FAST REUSE MEMORY BLOCKS AND MEMORY BLOCK MANAGEMENT METHODS USING THE SAME Public/Granted day:2017-12-07
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