公开(公告)号：US20130305008A1

公开(公告)日：2013-11-14

申请号：US13836595

申请日：2013-03-15

Applicant: SAMSUNG ELECTRONICS CO., LTD

Inventor： Jea-young Kwon ,  Shine Kim ,  Seong-jun Ahn ,  Woo-seok Chang ,  Da-woon Jung

IPC: G06F13/16

CPC classification number: G06F13/1689

Abstract: A method of controlling operation timing of memory devices included in a storage apparatus and a memory system including the method. The method includes adjusting operation timing such that a number of memory devices that simultaneously perform operations is below a reference value according to a host request, and issuing operations according to the adjusted operation timing and transferring the issued operations to the memory devices.

Abstract translation: 一种控制包括在存储装置中的存储器件的操作定时的方法和包括该方法的存储器系统。 该方法包括调整操作定时，使得同时执行操作的多个存储器件根据主机请求低于参考值，并根据调整的操作定时发出操作，并将发出的操作传送到存储器件。

公开(公告)号：US20170351459A1

公开(公告)日：2017-12-07

申请号：US15429496

申请日：2017-02-10

Applicant: Samsung Electronics Co., Ltd.

Inventor： Sang-kwon MOON ,  Jong-youl Lee ,  Seong-jun Ahn ,  Hee-won Lee

IPC: G06F3/06

CPC classification number: G06F3/0652 ,  G06F3/0608 ,  G06F3/0616 ,  G06F3/064 ,  G06F3/0679 ,  G06F12/02

Abstract: Fast reuse memory block detection methods and memory block management methods using the same are provided. A fast reuse memory block detection method may include selecting a memory block from memory blocks included in a nonvolatile memory device as a reference block at an initially set period, managing one of an erase time and a program time of the reference block, and determining whether other memory blocks are fast reuse memory blocks, based on a use period that is determined according to the managed one of the erase time and the program time of the reference block.

公开(公告)号：US10048892B2

公开(公告)日：2018-08-14

申请号：US15429496

申请日：2017-02-10

Applicant: Samsung Electronics Co., Ltd.

Inventor： Sang-kwon Moon ,  Jong-youl Lee ,  Seong-jun Ahn ,  Hee-won Lee

IPC: G06F3/06

Abstract: Fast reuse memory block detection methods and memory block management methods using the same are provided. A fast reuse memory block detection method may include selecting a memory block from memory blocks included in a nonvolatile memory device as a reference block at an initially set period, managing one of an erase time and a program time of the reference block, and determining whether other memory blocks are fast reuse memory blocks, based on a use period that is determined according to the managed one of the erase time and the program time of the reference block.