公开(公告)号：US10048892B2

公开(公告)日：2018-08-14

申请号：US15429496

申请日：2017-02-10

Applicant: Samsung Electronics Co., Ltd.

Inventor： Sang-kwon Moon ,  Jong-youl Lee ,  Seong-jun Ahn ,  Hee-won Lee

IPC: G06F3/06

Abstract: Fast reuse memory block detection methods and memory block management methods using the same are provided. A fast reuse memory block detection method may include selecting a memory block from memory blocks included in a nonvolatile memory device as a reference block at an initially set period, managing one of an erase time and a program time of the reference block, and determining whether other memory blocks are fast reuse memory blocks, based on a use period that is determined according to the managed one of the erase time and the program time of the reference block.