Method and system of sub pixel accuracy 3D measurement using multiple images

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US10063840B2 Method and system of sub pixel accuracy 3D measurement using multiple images 有权

Patent Title: Method and system of sub pixel accuracy 3D measurement using multiple images
Application No.: US14660843

Application Date: 2015-03-17
Publication No.: US10063840B2

Publication Date: 2018-08-28
Inventor: Gowri Somanath , Oscar Nestares
Applicant: INTEL CORPORATION
Applicant Address: US CA Santa Clara
Assignee: Intel Corporation
Current Assignee: Intel Corporation
Current Assignee Address: US CA Santa Clara
Agency: Green, Howard, & Mughal LLP.
Main IPC: H04N13/00
IPC: H04N13/00 ; H04N13/02 ; G06K9/00 ; G06K9/62

Abstract:

A system, article, and method of sub-pixel accuracy 3D measurement using multiple images.

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