Invention Grant
- Patent Title: Test structures and metrology technique utilizing the test structures for measuring in patterned structures
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Application No.: US15124445Application Date: 2015-03-10
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Publication No.: US10066936B2Publication Date: 2018-09-04
- Inventor: Igor Turovets
- Applicant: NOVA MEASURING INSTRUMENTS LTD.
- Applicant Address: IL Rehovot
- Assignee: NOVA MEASURING INSTRUMENTS LTD
- Current Assignee: NOVA MEASURING INSTRUMENTS LTD
- Current Assignee Address: IL Rehovot
- Agency: Browdy and Neimark, PLLC
- International Application: PCT/IL2015/050253 WO 20150310
- International Announcement: WO2015/136533 WO 20150917
- Main IPC: G01B11/02
- IPC: G01B11/02 ; G01B11/27 ; H01L21/66 ; G01N21/47 ; G01N21/956 ; G01N21/95 ; H01L21/033

Abstract:
An article is presented configured for controlling a multiple patterning process, such as a spacer self-aligned multiple patterning, to produce a target pattern. The article comprises a test site carrying a test structure comprising at least one pair of gratings, wherein first and second gratings of the pair are in the form of first and second patterns of alternating features and spaces and differ from the target pattern by respectively different first and second values which are selected to provide together a total difference such that a differential optical response from the test structure is indicative of a pitch walking effect.
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