Invention Grant
- Patent Title: Illuminance measuring system
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Application No.: US15784517Application Date: 2017-10-16
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Publication No.: US10067233B2Publication Date: 2018-09-04
- Inventor: Hisashi Isozaki , Atsushi Shoji , Akira Ooide
- Applicant: TOPCON Corporation
- Applicant Address: JP Tokyo-to
- Assignee: TOPCON Corporation
- Current Assignee: TOPCON Corporation
- Current Assignee Address: JP Tokyo-to
- Agency: Nields, Lemack & Frame, LLC
- Priority: JP2015-144009 20150721
- Main IPC: G01J1/00
- IPC: G01J1/00 ; G01S17/66 ; G01J3/02 ; G01J1/02

Abstract:
The invention provides an illuminance measuring system, which comprises an illuminance measuring instrument which comprises a first communication unit and is moved by a moving vehicle, a position measuring means which comprises a second communication unit and measures a three-dimensional position of the illuminance measuring instrument and a data collector which comprises a third communication unit and a storage unit for storing positional information data of a predetermined measuring point, wherein the data collector moves the moving vehicle to the measuring point based on a position of the illuminance measuring instrument and the positional information data, an illuminance is measured and a position of the illuminance measuring instrument is measured, and wherein the data collector obtains an illuminance measurement result from the illuminance measuring instrument, obtains a measuring position from the position measuring means, and collects the illuminance measurement result and the measuring position in association with each other.
Public/Granted literature
- US20180045829A1 Illuminance Measuring System Public/Granted day:2018-02-15
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