Method, apparatus and system for voltage compensation in a semiconductor wafer
Abstract:
At least one method, apparatus and system disclosed involves performing a dynamic voltage compensation in an integrated circuit. A first voltage on a first portion of an integrated circuit is received. A second voltage on a second portion of the integrated circuit is monitored. A determination is made as to whether the second voltage fell below the first voltage by a predetermined margin. A feedback adjustment of the of the second voltage is performed in response to a determination that the second voltage fell below the first voltage by the predetermined margin; the feedback adjustment comprises performing a step up of the second voltage.
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