Invention Grant
- Patent Title: FinFET structure with controlled air gaps
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Application No.: US15800359Application Date: 2017-11-01
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Publication No.: US10074558B1Publication Date: 2018-09-11
- Inventor: Wen-Che Tsai , Min-Yann Hsieh , Hua-Feng Chen , Kuo-Hua Pan
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsinchu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Current Assignee Address: TW Hsinchu
- Agency: Haynes and Boone, LLP
- Main IPC: H01L21/768
- IPC: H01L21/768 ; H01L23/532 ; H01L21/8234 ; H01L21/285 ; H01L21/311 ; H01L23/528

Abstract:
The present disclosure provides a method that includes forming an isolation feature in a semiconductor substrate; forming a first fin and a second fin on the semiconductor substrate, wherein the first and second fins are laterally separated by the isolation feature; and forming an elongated contact feature landing on the first and second fins. The elongated contact feature is further embedded in the isolation feature, enclosing an air gap vertically between the contact feature and the isolation feature.
Information query
IPC分类: