- 专利标题: Method for in-situ measuring electrical properties of carbon nanotubes
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申请号: US15598281申请日: 2017-05-17
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公开(公告)号: US10132767B2公开(公告)日: 2018-11-20
- 发明人: Jiang-Tao Wang , Xiang Jin , Peng Liu , Yang Wei , Kai-Li Jiang , Shou-Shan Fan
- 申请人: Tsinghua University , HON HAI PRECISION INDUSTRY CO., LTD.
- 申请人地址: CN Beijing TW New Taipei
- 专利权人: Tsinghua University,HON HAI PRECISION INDUSTRY CO., LTD.
- 当前专利权人: Tsinghua University,HON HAI PRECISION INDUSTRY CO., LTD.
- 当前专利权人地址: CN Beijing TW New Taipei
- 代理机构: ScienBiziP, P.C.
- 主分类号: G01R29/24
- IPC分类号: G01R29/24 ; G01N27/02 ; H01L51/00 ; H01L21/66 ; C23C16/26 ; C23C16/46 ; G01N27/22 ; G01R15/12 ; G01R31/02 ; C23C16/52 ; B82Y40/00
摘要:
A method for in-situ measuring electrical properties of carbon nanotubes includes placing a first electrode in a chamber, wherein the first electrode defines a cavity. A growth substrate is suspend inside of the cavity, and a catalyst layer is located on the growth substrate. A measuring meter having a first terminal and a second terminal opposite to the first terminal is provided. The first terminal is electrically connected to the first electrode, and the second terminal is electrically connected to the growth substrate. A carbon source gas, a protective gas, and hydrogen are supplied to the cavity, to grow the carbon nanotubes on the catalyst layer. The electrical properties of the carbon nanotubes are obtained by the measuring meter.
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