Invention Grant
- Patent Title: Method for defect indication detection
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Application No.: US15100567Application Date: 2014-12-01
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Publication No.: US10203290B2Publication Date: 2019-02-12
- Inventor: Andrew Frank Ferro , Xingwei Yang , Paulo Ricardo dos Santos Mendonca , Christopher Allen Nafis , Patrick Joseph Howard
- Applicant: General Electric Company
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: General Electric Company
- Agent William Andes
- International Application: PCT/US2014/067895 WO 20141201
- International Announcement: WO2015/088803 WO 20150618
- Main IPC: G21K1/02
- IPC: G21K1/02 ; G01N23/18 ; A61B6/00 ; G01N23/046
Abstract:
Methods, apparatus and computer-readable media for detecting potential defects in a part are disclosed. A potential defect may be automatically detected in a part, and may be reported to an operator in various ways so that the operator may review the defect and take appropriate action.
Public/Granted literature
- US20160305895A1 METHOD FOR DEFECT INDICATION DETECTION Public/Granted day:2016-10-20
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