公开(公告)号：US10481108B2

公开(公告)日：2019-11-19

申请号：US16233161

申请日：2018-12-27

Applicant: General Electric Company

Inventor： Andrew Frank Ferro ,  Xingwei Yang ,  Paulo Ricardo dos Santos Mendonca ,  Christopher Allen Nafis ,  Patrick Joseph Howard

IPC: G01N23/18 ,  A61B6/00 ,  G01N23/046 ,  G01N21/00 ,  G06T7/00

Abstract: Methods, apparatus and computer-readable media for detecting potential defects in a part are disclosed. A potential defect may be automatically detected in a part, and may be reported to an operator in various ways so that the operator may review the defect and take appropriate action.

公开(公告)号：US11408836B2

公开(公告)日：2022-08-09

申请号：US16804781

申请日：2020-02-28

Applicant: General Electric Company

Inventor： Patrick Joseph Howard ,  John Charles Janning ,  Andrew Joseph Galish ,  Kevin Layne Moermond

IPC: G01N23/046 ,  G06T7/62

Abstract: A method of inspecting a component using computed tomography is described, the method comprising the steps of: (a) providing a computed tomography (CT) scanner; (b) providing a target component; (c) reviewing the geometry of the component; (d) estimating the best component orientation; (e) orienting the component; (f) scanning the component with the CT scanner; (g) loading CT scan data into 3D image software; (h) registering the best CT scan data; (i) determining acceptable and unacceptable regions of CT scan data; (j) determining additional component orientations; (k) repeating steps (e) through (i) until all regions of CT scan data for the component are acceptable; and (l) creating a merged volume of acceptable CT scan data.

公开(公告)号：US11301977B2

公开(公告)日：2022-04-12

申请号：US16845324

申请日：2020-04-10

Applicant: General Electric Company

Inventor： Alberto Santamaria-Pang ,  Yousef Al-Kofahi ,  Aritra Chowdhury ,  Shourya Sarcar ,  Michael John MacDonald ,  Peter Arjan Wassenaar ,  Patrick Joseph Howard ,  Bruce Courtney Amm ,  Eric Seth Moderbacher

IPC: G06K9/00 ,  G06T7/00 ,  G06K9/62

Abstract: An image inspection computing device is provided. The device includes a memory device and at least one processor. The at least one processor is configured to receive at least one sample image of a first component, wherein the at least one sample image of the first component does not include defects, store, in the memory, the at least one sample image, and receive an input image of a second component. The at least one processor is also configured to generate an encoded array based on the input image of the second component, perform a stochastic data sampling process on the encoded array, generate a decoded array, and generate a reconstructed image of the second component, derived from the stochastic data sampling process and the decoded array. The at least one processor is further configured to produce a residual image, and identify defects in the second component.

公开(公告)号：US10203290B2

公开(公告)日：2019-02-12

申请号：US15100567

申请日：2014-12-01

Applicant: General Electric Company

Inventor： Andrew Frank Ferro ,  Xingwei Yang ,  Paulo Ricardo dos Santos Mendonca ,  Christopher Allen Nafis ,  Patrick Joseph Howard

IPC: G21K1/02 ,  G01N23/18 ,  A61B6/00 ,  G01N23/046

Abstract: Methods, apparatus and computer-readable media for detecting potential defects in a part are disclosed. A potential defect may be automatically detected in a part, and may be reported to an operator in various ways so that the operator may review the defect and take appropriate action.

公开(公告)号：US20200309719A1

公开(公告)日：2020-10-01

申请号：US16804781

申请日：2020-02-28

Applicant: General Electric Company

Inventor： Patrick Joseph Howard ,  John Charles Janning ,  Andrew Joseph Galish ,  Kevin Layne Moermond

IPC: G01N23/046 ,  G06T7/62

Abstract: A method of inspecting a component using computed tomography is described, the method comprising the steps of: (a) providing a computed tomography (CT) scanner; (b) providing a target component; (c) reviewing the geometry of the component; (d) estimating the best component orientation; (e) orienting the component; (f) scanning the component with the CT scanner; (g) loading CT scan data into 3D image software; (h) registering the best CT scan data; (i) determining acceptable and unacceptable regions of CT scan data; (j) determining additional component orientations; (k) repeating steps (e) through (i) until all regions of CT scan data for the component are acceptable; and (l) creating a merged volume of acceptable CT scan data.

公开(公告)号：US20210319544A1

公开(公告)日：2021-10-14

申请号：US16845324

申请日：2020-04-10

Applicant: General Electric Company

Inventor： Alberto Santamaria-Pang ,  Yousef Al-Kofahi ,  Aritra Chowdhury ,  Shourya Sarcar ,  Michael John MacDonald ,  Peter Arjan Wassenaar ,  Patrick Joseph Howard ,  Bruce Courtney Amm ,  Eric Seth Moderbacher

IPC: G06T7/00 ,  G06K9/62

Abstract: An image inspection computing device is provided. The device includes a memory device and at least one processor. The at least one processor is configured to receive at least one sample image of a first component, wherein the at least one sample image of the first component does not include defects, store, in the memory, the at least one sample image, and receive an input image of a second component. The at least one processor is also configured to generate an encoded array based on the input image of the second component, perform a stochastic data sampling process on the encoded array, generate a decoded array, and generate a reconstructed image of the second component, derived from the stochastic data sampling process and the decoded array. The at least one processor is further configured to produce a residual image, and identify defects in the second component.