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公开(公告)号:US20240319115A1
公开(公告)日:2024-09-26
申请号:US18577705
申请日:2022-07-08
申请人: UNIVERSITE TOULOUSE III - PAUL SABATIER , COMPOSITE EXPERTISE ET SOLUTIONS , CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
CPC分类号: G01N23/04 , B32B7/12 , C09J9/00 , C09J11/04 , G01N23/083 , G01N23/18 , B32B2264/105 , B32B2307/208 , G01N2223/615
摘要: Method for generating a map representing mechanically altered zones of an adhesive in a glued assembly of composite materials, corresponding device and computer program.
The invention relates to a method for determining the state of the mechanical properties of a glued assembly of materials by applying a local thermal source exciting particles included in the adhesive and studying the consequences of this excitation on the mechanical properties of the adhesive by high-frequency electromagnetic imaging.-
公开(公告)号:US20240310307A1
公开(公告)日:2024-09-19
申请号:US18605640
申请日:2024-03-14
申请人: Curpow Inc.
发明人: Michael LeClair , Ian Jenkins
IPC分类号: G01N23/18 , G01N23/044 , G01N23/083 , G01N23/16 , G01T1/20 , H01M10/04
CPC分类号: G01N23/18 , G01N23/044 , G01N23/083 , G01N23/16 , G01T1/2002 , G01T1/20186 , G01T1/20187 , H01M10/0404 , G01N2223/505 , G01N2223/611
摘要: An apparatus is configured to monitor a plurality of layers of a battery layer stack during manufacturing. The apparatus includes at least one X-ray source configured to generate X-rays with X-ray energies that exhibit contrast of transmission through the plurality of layers of the battery layer stack. The at least one X-ray source is configured to face a first side of the battery layer stack. The apparatus further includes at least one sensor configured to detect the X-rays transmitted through the plurality of layers. The at least one sensor is configured to face a second side of the battery layer stack.
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公开(公告)号:US20240310306A1
公开(公告)日:2024-09-19
申请号:US18182975
申请日:2023-03-13
申请人: The Boeing Company
发明人: Morteza SAFAI
IPC分类号: G01N23/18 , G01N23/04 , G01N23/083
CPC分类号: G01N23/18 , G01N23/04 , G01N23/083 , G01N2223/20 , G01N2223/33
摘要: A system for radiographic inspection includes a line source that emits a fan shaped beam of x-rays and a linear x-ray detector that detects the fan shaped beam of x-rays. The system further includes a first movable platform that positions the line source to emit the fan shaped beam of x-rays towards the linear x-ray detector. A second movable platform positions the linear x-ray detector to detect the fan shaped beam of x-rays after transmission through the structure or component being inspected. Synchronized movement of the first movable platform and the second movable platform significantly reduces the time of inspection while the fan shaped beam of x-rays minimizes health risks. The system further includes a first filter that blocks x-rays below a first energy threshold, and a second filter that blocks x-rays below a second energy threshold. The filters provide the system the ability to inspect structures and components formed of multiple types of materials, for example, foreign object debris.
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公开(公告)号:US20240255444A1
公开(公告)日:2024-08-01
申请号:US18412139
申请日:2024-01-12
发明人: Satoshi MATSUBARA
IPC分类号: G01N23/083 , A61B6/00 , A61B6/40 , G01N23/04 , G01N23/18
CPC分类号: G01N23/083 , A61B6/40 , A61B6/56 , G01N23/04 , G01N23/18 , G01N2223/1016 , G01N2223/652
摘要: Proposed are an X-ray transmission inspection apparatus and an X-ray transmission inspection method, in which transmission images with large difference between irradiation angles are obtained so that the depth of the position of a foreign object can be obtained with high precision. The X-ray transmission inspection apparatus includes an X-ray source, an X-ray sensor configured to detect a transmitted X-ray, a moving mechanism configured to move the sample, and a calculation part configured to calculate a height position of a foreign object in a thickness direction in the sample, wherein the X-ray source performs irradiation with X-rays in a direction tilted with respect to the thickness direction of the sample and a transport direction of the sample, and the moving mechanism is capable of moving the sample in a first transport direction and in a second transport direction, and of changing X-ray irradiation angles.
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公开(公告)号:US12038394B2
公开(公告)日:2024-07-16
申请号:US17046327
申请日:2019-04-11
发明人: Daniel Constantinis
CPC分类号: G01N23/18 , G01N23/04 , G06T7/0004 , G01N2223/646 , G06T2207/10124 , G06T2207/30164
摘要: Method of inspecting hazardous area equipment (10, 110, 210). The method is a non-invasive inspection of an electrical or electronic component of the hazardous area equipment (10, 110, 210). The non-invasive inspection includes a radiographic inspection of the equipment (10, 110, 210).
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公开(公告)号:US20240230933A9
公开(公告)日:2024-07-11
申请号:US18011523
申请日:2022-05-03
申请人: DRTECH CORP
发明人: Beom Jin MOON , Hyeong Sik KIM , Nam Won KIM , Yong Cheol GIL
摘要: The present inventive concept relates to: a radiation detector including a bendable radiation detecting panel and a radiation inspection apparatus including same. The radiation detector includes: a radiation detecting panel which is flexible, extending in a first direction, and detecting radiation incident to a first face; and a bending support unit which is plate-shaped, provided on a second face of the radiation detecting panel opposite to the first face to support the radiation detecting panel, and having a flexibility. The flexibility of the bending support unit is less than a flexibility of the radiation detecting panel.
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公开(公告)号:US11971370B2
公开(公告)日:2024-04-30
申请号:US18350255
申请日:2023-07-11
发明人: Takeo Tsukamoto
IPC分类号: G01N23/04 , G01N23/083 , G01N23/18 , G01N23/20008 , G01N23/2206 , G01N23/223 , G21K7/00 , H01J35/18
CPC分类号: G01N23/18 , G01N23/04 , G01N23/083 , G01N23/20008 , G01N23/2206 , G01N23/223 , G21K7/00 , H01J35/186 , G01N2223/04 , G01N2223/052 , G01N2223/071 , G01N2223/076 , G01N2223/1016 , G01N2223/20 , G01N2223/204 , G01N2223/32 , G01N2223/643 , G01N2223/652
摘要: An inspection apparatus for inspecting an inspection target object, includes an X-ray generation tube having a target including an X ray generation portion that generates X-rays by irradiation with an electron beam, and configured to emit X-rays to an inspection target surface of the inspection target object, an X-ray detector configured to detect X-rays emitted from a foreign substance existing on the inspection target surface irradiated with the X-rays from the X ray generation portion and totally reflected by the inspection target surface, and an adjustment mechanism configured to adjust a relative position between the inspection target surface and the X-ray detector.
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公开(公告)号:US11946883B1
公开(公告)日:2024-04-02
申请号:US17454865
申请日:2021-11-15
发明人: Ajay M Koshti
IPC分类号: G01N23/18 , G01N23/04 , G01N23/083 , G06T7/00
CPC分类号: G01N23/18 , G01N23/04 , G01N23/083 , G06T7/0004 , G01N2223/1016 , G01N2223/3035 , G01N2223/3037 , G01N2223/305 , G01N2223/401 , G01N2223/415 , G01N2223/42 , G01N2223/426 , G01N2223/629 , G01N2223/6466 , G06T2207/30136 , G06T2207/30168
摘要: A method includes determining a predicted contrast-to-noise ratio sensitivity function (CNR SF) for crack detection of a predetermined target flaw size with the radiographic inspection system in the selected set-up. The method also includes qualifying an inspection image quality indicator (IQI) for the predetermined target flaw size for use in the radiographic inspection system in the selected set-up. The method also includes performing an inspection process. The inspection process includes selecting the qualified inspection IQI for the predetermined target flaw size. The inspection process also includes performing an inspection test on the qualified inspection IQI using the radiographic inspection system in the selected set-up. The inspection process also includes determining one or more inspection output parameters. The inspection process also includes verifying that the one or more inspection output parameters meet or exceed minimum qualified values to qualify the radiographic inspection system in the selected set-up.
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公开(公告)号:US11918403B2
公开(公告)日:2024-03-05
申请号:US17548366
申请日:2021-12-10
申请人: Jianqiang Liu , Manat Maolinbay , Chwen-yuan Ku , Linbo Yang
发明人: Jianqiang Liu , Manat Maolinbay , Chwen-yuan Ku , Linbo Yang
IPC分类号: A61B6/00 , A61B6/02 , A61B6/03 , A61B6/04 , A61B6/06 , A61B6/08 , G01N23/044 , G01N23/083 , G01N23/18 , G06T7/00 , G06T7/11 , G06T11/00 , G06T17/00 , G06V10/25 , G06V10/62 , G16H10/60 , G16H30/20 , G16H50/20
CPC分类号: A61B6/541 , A61B6/025 , A61B6/032 , A61B6/035 , A61B6/0407 , A61B6/06 , A61B6/08 , A61B6/4007 , A61B6/4014 , A61B6/4021 , A61B6/405 , A61B6/4208 , A61B6/4283 , A61B6/4405 , A61B6/4441 , A61B6/4452 , A61B6/4476 , A61B6/4482 , A61B6/467 , A61B6/482 , A61B6/54 , A61B6/542 , A61B6/56 , A61B6/583 , G01N23/044 , G01N23/083 , G01N23/18 , G06T7/0012 , G06T7/0016 , G06T7/11 , G06T11/003 , G06T11/006 , G06T17/00 , G06V10/25 , G06V10/62 , G16H10/60 , G16H30/20 , G16H50/20 , A61B6/4275 , A61B6/502 , G01N2223/401 , G06T2200/24 , G06T2207/10076 , G06T2207/10081 , G06T2207/20081 , G06T2207/20084 , G06T2207/30064 , G06T2207/30096 , G06T2207/30168 , G06T2210/41 , G06V2201/032
摘要: System and method are disclosed for imaging acquisition from sparse partial scans of distributed wide angle. During real time image reconstruction, artificial intelligence (AI) determines if there is enough information to perform diagnostics based on initial scans. If there is enough information from the fractional scans, then data acquisition stops; if more information is needed, then system performs another round of wide-angle sparse scans in a new location progressively until a result is satisfactory. The system reduces X-ray dose on a patient and performs quicker X-ray scan at multiple pulsed source-in-motion tomosynthesis imaging system. The method and system also significantly reduce the amount of time required to display high quality three-dimensional tomosynthesis images.
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10.
公开(公告)号:US20230404499A1
公开(公告)日:2023-12-21
申请号:US18344342
申请日:2023-06-29
申请人: Hologic, Inc.
发明人: Kenneth DeFreitas , Timothy N. Wells , Thomas DeYoung , Henry Landry , Shawn St. Pierre , Shawn Hochstetler , Joseph Vartolone , Neil Roth , Michelle Lustrino
IPC分类号: A61B6/00 , G01N23/04 , G21K7/00 , G01N23/18 , G01N23/083 , G01N23/087 , G01N23/06
CPC分类号: A61B6/4435 , G01N23/04 , A61B6/588 , G21K7/00 , A61B6/587 , A61B6/508 , A61B6/4233 , A61B6/44 , G01N23/18 , A61B6/4208 , A61B6/4411 , G01N23/083 , G01N23/087 , A61B6/4405 , A61B6/40 , A61B6/42 , A61B6/4429 , G01N23/06 , A61B6/4441 , A61B6/4447 , A61B6/4452 , A61B6/469 , A61B6/461 , A61B6/465 , A61B6/46 , A61B6/463 , A61B6/467 , A61B6/542 , G01N2223/301 , G01N2223/309 , G01N2223/3306 , G01N2223/3307 , G01N2223/6126 , A61B6/4423
摘要: A specimen radiography system may include a controller and a cabinet. The cabinet may include an x-ray source, an x-ray detector, and a specimen drawer disposed between the x-ray source and the x-ray detector. The specimen drawer may be automatically positionable along a vertical axis between the x-ray source and the x-ray detector.
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