Invention Grant
- Patent Title: Method for fabricating capacitor
-
Application No.: US15859763Application Date: 2018-01-02
-
Publication No.: US10204911B2Publication Date: 2019-02-12
- Inventor: Chieh-Te Chen , Feng-Yi Chang , Fu-Che Lee
- Applicant: UNITED MICROELECTRONICS CORP. , Fujian Jinhua Integrated Circuit Co., Ltd.
- Applicant Address: TW Hsin-Chu CN Quanzhou, Fujian Province
- Assignee: UNITED MICROELECTRONICS CORP.,Fujian Jinhua Integrated Circuit Co., Ltd.
- Current Assignee: UNITED MICROELECTRONICS CORP.,Fujian Jinhua Integrated Circuit Co., Ltd.
- Current Assignee Address: TW Hsin-Chu CN Quanzhou, Fujian Province
- Agent Winston Hsu
- Priority: CN201710011359 20170106
- Main IPC: H01L21/033
- IPC: H01L21/033 ; H01L21/311 ; H01L27/108 ; H01L21/02 ; H01L49/02 ; H01L21/027

Abstract:
A method for fabricating a capacitor includes providing a substrate and a first etching stop layer on the substrate; forming a plurality of first spacers on the first etching stop layer; forming an organic layer and a second etching stop layer sequentially on the first spacers, the organic layer covering the first spacers; forming a plurality of second spacers on the second etching stop layer, each second spacer crossing the first spacers; transferring a pattern of the second spacers to the organic layer to form an organic pattern; performing an etching process using the organic pattern and the first spacers as a mask to form an etching stop pattern and remove the second etching stop layer; transferring the etching stop pattern to the substrate to form a plurality of through holes.
Public/Granted literature
- US20180197863A1 METHOD FOR FABRICATING CAPACITOR Public/Granted day:2018-07-12
Information query
IPC分类: