A detachable probe card interface comprises a space transformer, a deformable connector, and a carrier board. The space transformer includes first electrical contacts and second electrical contacts, wherein the first electrical contacts are coupled to the second electrical contacts through one or more layers of the space transformer. The deformable connector includes a plurality of conductive particles arranged in columns coinciding with the second electrical contacts, wherein the conductive particles compress with one another when one or more forces are exerted on the deformable connector. The carrier board includes a plurality of vias aligned with the plurality of second electrical contacts on the space transformer, and a plurality of conductors disposed within the vias. Each of the conductors is coupled to a respective one of the second electrical contacts and protrudes into the deformable connector to establish a transmission path between the second electrical contact and one or more columns of the conductive particles.