Invention Grant
- Patent Title: White box testing
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Application No.: US15275739Application Date: 2016-09-26
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Publication No.: US10210076B2Publication Date: 2019-02-19
- Inventor: Da L. Huang , Zhang Wu , Lu Yu , Xin Zhang , Yun Jie Zhou
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Scott S. Dobson
- Main IPC: G06F11/36
- IPC: G06F11/36

Abstract:
The source code of a software artifact may be scanned, and a call tree model with leaf nodes may be generated based on the scan. A set of test cases can be executed against the software artifact and log data from the execution can be collected. A set of untested leaf nodes can be detected and a new set of test cases can be generated to test the untested nodes. The new set of test cases are executed and a subset of the test cases which cover the previously untested nodes are added to the existing set of test cases.
Public/Granted literature
- US20180089067A1 WHITE BOX TESTING Public/Granted day:2018-03-29
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