WHITE BOX TESTING
    1.
    发明申请

    公开(公告)号:US20180089070A1

    公开(公告)日:2018-03-29

    申请号:US15677189

    申请日:2017-08-15

    IPC分类号: G06F11/36

    摘要: The source code of a software artifact may be scanned, and a call tree model with leaf nodes may be generated based on the scan. A set of test cases can be executed against the software artifact and log data from the execution can be collected. A set of untested leaf nodes can be detected and a new set of test cases can be generated to test the untested nodes. The new set of test cases are executed and a subset of the test cases which cover the previously untested nodes are added to the existing set of test cases.

    WHITE BOX TESTING
    2.
    发明申请
    WHITE BOX TESTING 审中-公开

    公开(公告)号:US20180137037A1

    公开(公告)日:2018-05-17

    申请号:US15885879

    申请日:2018-02-01

    IPC分类号: G06F11/36

    摘要: The source code of a software artifact may be scanned, and a call tree model with leaf nodes may be generated based on the scan. A set of test cases can be executed against the software artifact and log data from the execution can be collected. A set of untested leaf nodes can be detected and a new set of test cases can be generated to test the untested nodes. The new set of test cases are executed and a subset of the test cases which cover the previously untested nodes are added to the existing set of test cases.

    White box testing
    3.
    发明授权

    公开(公告)号:US09916230B1

    公开(公告)日:2018-03-13

    申请号:US15677189

    申请日:2017-08-15

    IPC分类号: G06F9/45 G06F11/36

    摘要: The source code of a software artifact may be scanned, and a call tree model with leaf nodes may be generated based on the scan. A set of test cases can be executed against the software artifact and log data from the execution can be collected. A set of untested leaf nodes can be detected and a new set of test cases can be generated to test the untested nodes. The new set of test cases are executed and a subset of the test cases which cover the previously untested nodes are added to the existing set of test cases.

    TIERED STORAGE OPTIMIZATION AND MIGRATION
    4.
    发明申请

    公开(公告)号:US20200326871A1

    公开(公告)日:2020-10-15

    申请号:US16379068

    申请日:2019-04-09

    IPC分类号: G06F3/06

    摘要: Systems, methods, and computer program products for automating the management of a tiered storage system, which improves the service life and costs of the flash-based storage devices that comprise the storage system. The systems, methods and program products utilize time series learning models to predict the write frequency of each data block for the next cycle of time. Using the write frequency predictions, management of the tiered flash-based storage system can automatically organize and migrate stored data based on storage costs, migration costs and frequency in which the data is accessed. Data that is more frequently accessed and updated is migrated to high-end flash-based storage devices, which are able to endure a greater number of program/erase cycles, while less frequently accessed data is migrated to less expensive, low-end flash-based storage devices, that have a lower maximum number program/erase cycles.

    White box testing
    5.
    发明授权

    公开(公告)号:US10210076B2

    公开(公告)日:2019-02-19

    申请号:US15275739

    申请日:2016-09-26

    IPC分类号: G06F11/36

    摘要: The source code of a software artifact may be scanned, and a call tree model with leaf nodes may be generated based on the scan. A set of test cases can be executed against the software artifact and log data from the execution can be collected. A set of untested leaf nodes can be detected and a new set of test cases can be generated to test the untested nodes. The new set of test cases are executed and a subset of the test cases which cover the previously untested nodes are added to the existing set of test cases.

    WHITE BOX TESTING
    6.
    发明申请
    WHITE BOX TESTING 审中-公开

    公开(公告)号:US20180137038A1

    公开(公告)日:2018-05-17

    申请号:US15885881

    申请日:2018-02-01

    IPC分类号: G06F11/36

    摘要: The source code of a software artifact may be scanned, and a call tree model with leaf nodes may be generated based on the scan. A set of test cases can be executed against the software artifact and log data from the execution can be collected. A set of untested leaf nodes can be detected and a new set of test cases can be generated to test the untested nodes. The new set of test cases are executed and a subset of the test cases which cover the previously untested nodes are added to the existing set of test cases.

    WHITE BOX TESTING
    7.
    发明申请
    WHITE BOX TESTING 审中-公开

    公开(公告)号:US20180089067A1

    公开(公告)日:2018-03-29

    申请号:US15275739

    申请日:2016-09-26

    IPC分类号: G06F11/36

    摘要: The source code of a software artifact may be scanned, and a call tree model with leaf nodes may be generated based on the scan. A set of test cases can be executed against the software artifact and log data from the execution can be collected. A set of untested leaf nodes can be detected and a new set of test cases can be generated to test the untested nodes. The new set of test cases are executed and a subset of the test cases which cover the previously untested nodes are added to the existing set of test cases.