Invention Grant
- Patent Title: Method and apparatus for measuring 3D refractive-index tomograms using high-speed wavefront shaper
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Application No.: US14981355Application Date: 2015-12-28
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Publication No.: US10215697B2Publication Date: 2019-02-26
- Inventor: YongKeun Park , Kyoohyun Kim , Seungwoo Shin
- Applicant: Korea Advanced Institute of Science and Technology
- Applicant Address: KR Daejeon
- Assignee: TOMOCUBE, INC.
- Current Assignee: TOMOCUBE, INC.
- Current Assignee Address: KR Daejeon
- Agency: Fenwick & West LLP
- Priority: KR10-2015-0102417 20150720
- Main IPC: G01N21/45
- IPC: G01N21/45

Abstract:
A method and apparatus for measuring 3D refractive-index tomograms using a wavefront shaper in ultra-high speed and high precision is provided. The method includes the steps of modifying at least one of an illumination angle and a wavefront pattern of an incident ray through the wavefront shaper and leading the modified incident ray to a sample, measuring a 2D optical field, which passes through the sample, through an interferometry along at least one or more of the incident rays, and obtaining 3D refractive-index tomograms through measured information of the 2D optical field.
Public/Granted literature
- US20170023471A1 METHOD AND APPARATUS FOR MEASURING 3D REFRACTIVE-INDEX TOMOGRAMS USING HIGH-SPEED WAVEFRONT SHAPER Public/Granted day:2017-01-26
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