Patent search ap:("Korea Advanced Institute of Science AND Technology") AND inv:"Kyoohyun Kim" Page 1

$Method and apparatus for measuring 3D refractive-index tomograms using high-speed wavefront shaper$

1.

发明授权
Method and apparatus for measuring 3D refractive-index tomograms using high-speed wavefront shaper 有权

公开(公告)号：US10215697B2

公开(公告)日：2019-02-26

申请号：US14981355

申请日：2015-12-28

Applicant: Korea Advanced Institute of Science and Technology

Inventor： YongKeun Park , Kyoohyun Kim , Seungwoo Shin

IPC: G01N21/45

Abstract: A method and apparatus for measuring 3D refractive-index tomograms using a wavefront shaper in ultra-high speed and high precision is provided. The method includes the steps of modifying at least one of an illumination angle and a wavefront pattern of an incident ray through the wavefront shaper and leading the modified incident ray to a sample, measuring a 2D optical field, which passes through the sample, through an interferometry along at least one or more of the incident rays, and obtaining 3D refractive-index tomograms through measured information of the 2D optical field.

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