- 专利标题: Position sensing in a probe to modify transfer characteristics in a system
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申请号: US14923242申请日: 2015-10-26
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公开(公告)号: US10215776B2公开(公告)日: 2019-02-26
- 发明人: Julie A. Campbell , Josiah A. Bartlett , David A. Sailor , Jay Schwichtenberg
- 申请人: Tektronix, Inc.
- 申请人地址: US OR Beaverton
- 专利权人: Tektronix, Inc.
- 当前专利权人: Tektronix, Inc.
- 当前专利权人地址: US OR Beaverton
- 代理商 Andrew J. Harrington
- 主分类号: G01R1/067
- IPC分类号: G01R1/067 ; G01R35/00 ; G01R1/073
摘要:
Test and measurement probes include a body, an adjustable member moveably coupled to the body and having a changeable position relative to the body, and a transducer subsystem structured to measure the position of the adjustable member and configured to output a position signal indicative of the position of the adjustable member. A change in the position of the adjustable member causes a change in an electrical characteristic of the probe. A position-dependent correction factor may be used to correct the change in the electrical characteristic. Methods of compensating for a change in a response of a test and measurement system include monitoring a position sensor output to detect a position change of a first part of a probe relative to a second part, determining that the position sensor output value has crossed a boundary value between a first and second range, and applying a compensation factor corresponding to the second range to modify the response of the system.
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