Invention Grant
- Patent Title: Position sensing in a probe to modify transfer characteristics in a system
-
Application No.: US14923242Application Date: 2015-10-26
-
Publication No.: US10215776B2Publication Date: 2019-02-26
- Inventor: Julie A. Campbell , Josiah A. Bartlett , David A. Sailor , Jay Schwichtenberg
- Applicant: Tektronix, Inc.
- Applicant Address: US OR Beaverton
- Assignee: Tektronix, Inc.
- Current Assignee: Tektronix, Inc.
- Current Assignee Address: US OR Beaverton
- Agent Andrew J. Harrington
- Main IPC: G01R1/067
- IPC: G01R1/067 ; G01R35/00 ; G01R1/073

Abstract:
Test and measurement probes include a body, an adjustable member moveably coupled to the body and having a changeable position relative to the body, and a transducer subsystem structured to measure the position of the adjustable member and configured to output a position signal indicative of the position of the adjustable member. A change in the position of the adjustable member causes a change in an electrical characteristic of the probe. A position-dependent correction factor may be used to correct the change in the electrical characteristic. Methods of compensating for a change in a response of a test and measurement system include monitoring a position sensor output to detect a position change of a first part of a probe relative to a second part, determining that the position sensor output value has crossed a boundary value between a first and second range, and applying a compensation factor corresponding to the second range to modify the response of the system.
Public/Granted literature
- US20170115325A1 Position Sensing in a Probe to Modify Transfer Characteristics in a System Public/Granted day:2017-04-27
Information query