- 专利标题: Methods and apparatus for conditioning of chemical mechanical polishing pads
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申请号: US13801127申请日: 2013-03-13
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公开(公告)号: US10226853B2公开(公告)日: 2019-03-12
- 发明人: Rajeev Bajaj , Hung Chih Chen
- 申请人: Rajeev Bajaj , Hung Chih Chen
- 申请人地址: US CA Santa Clara
- 专利权人: Applied Materials, Inc.
- 当前专利权人: Applied Materials, Inc.
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Patterson + Sheridan, LLP
- 主分类号: B24B53/017
- IPC分类号: B24B53/017 ; B23K26/38 ; B24B37/34
摘要:
A method and apparatus for conditioning a polishing pad is provided. In one embodiment, a pad conditioning device for a substrate polishing process is provided. The pad conditioning device includes an optical device coupled to a portion of a polishing station adjacent a polishing pad, the optical device comprising a laser emitter adapted to emit a beam toward a polishing surface of the polishing pad, the beam having a wavelength range that is substantially non-reactive with a polishing fluid utilized in the polishing process, but is reactive with the polishing pad.
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