A computer-implemented method, system, and/or computer program product controls manufacturing devices in a manufacturing environment. One or more processors receive sensor readings, which detect conditions that are unique to different areas within the manufacturing environment, in order to generate models of operations for each area in the manufacturing environment. One or more processors generate an ensemble model by extracting information from the models to describe a relationship between the conditions. One or more processors generate a device control signal, based on the ensemble model, that adjusts operations in the different areas in order to ameliorate the detected conditions.