Invention Grant
- Patent Title: Variable-term error metrics adjustment
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Application No.: US15195910Application Date: 2016-06-28
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Publication No.: US10228990B2Publication Date: 2019-03-12
- Inventor: Yiwei Song , Nian Niles Yang , James Fitzpatrick
- Applicant: SanDisk Technologies LLC
- Applicant Address: US TX Plano
- Assignee: SANDISK TECHNOLOGIES LLC
- Current Assignee: SANDISK TECHNOLOGIES LLC
- Current Assignee Address: US TX Plano
- Agency: Morgan, Lewis & Bockius LLP
- Main IPC: G06F11/07
- IPC: G06F11/07 ; G06F12/02 ; G11C16/34 ; G06F11/08 ; G11C29/44 ; G11C29/04

Abstract:
Systems, methods and/or devices are used to adjust error metrics for a memory portion of non-volatile memory in a storage device. In one aspect, a first write and a first read are performed on the memory portion. In accordance with results of the first read, a first error metric value for the memory portion is determined. In accordance with a determination that the first error metric value exceeds a first threshold value, an entry for the memory portion is added to a table. After the first write, when a second write to the memory portion is performed, it is determined whether the entry for the memory portion is present in the table. In accordance with a determination that the entry for the memory portion is present in the table, the second write uses a first error adjustment characteristic that is determined in accordance with the first error metric value.
Public/Granted literature
- US20170139761A1 Variable-Term Error Metrics Adjustment Public/Granted day:2017-05-18
Information query