Invention Grant
- Patent Title: Array substrates testing circuits, display panels, and flat display devices
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Application No.: US15111765Application Date: 2016-06-12
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Publication No.: US10235913B2Publication Date: 2019-03-19
- Inventor: Mang Zhao , Liang Ma
- Applicant: Wuhan China Star Optoelectronics Technology Co., Ltd.
- Applicant Address: CN Wuhan, Hubei
- Assignee: Wuhan China Star Optoelectronics Technology Co., Ltd
- Current Assignee: Wuhan China Star Optoelectronics Technology Co., Ltd
- Current Assignee Address: CN Wuhan, Hubei
- Agent Andrew C. Cheng
- Priority: CN201610345572 20160523
- International Application: PCT/CN2016/085462 WO 20160612
- International Announcement: WO2017/201773 WO 20171130
- Main IPC: G02F1/13
- IPC: G02F1/13 ; G01R31/26 ; G09G3/00 ; G02F1/1368 ; G02F1/1362

Abstract:
A testing circuit includes at least one sub-circuit. The sub-circuit includes a first input end, at least one second input end, at least one third input end, and at least one driving output end. The first switch unit includes controllable switches. The second switch unit includes sub-units and first inverters. The sub-unit includes transmission gates. The control end of the controllable switch connects to the second input end, the first end connects to the first input end, and the second end connects to the input end of the transmission gate. The first control end of the transmission gate connects to the third input end and the input end of the first inverter, the second control end connects to the output end of the first inverter, the output end connects to the driving output end.
Public/Granted literature
- US20180108285A1 ARRAY SUBSTRATES TESTING CIRCUITS, DISPLAY PANELS, AND FLAT DISPLAY DEVICES Public/Granted day:2018-04-19
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