Invention Grant
- Patent Title: Quantitative secondary electron detection
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Application No.: US15521278Application Date: 2015-10-21
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Publication No.: US10256071B2Publication Date: 2019-04-09
- Inventor: Jyoti Agrawal , David C. Joy , Subuhadarshi Nayak
- Applicant: ScienceTomorrow
- Applicant Address: US KY Lexington
- Assignee: Science Tomorrow LLC
- Current Assignee: Science Tomorrow LLC
- Current Assignee Address: US KY Lexington
- Agent Peter G. Willis
- International Application: PCT/US2015/056787 WO 20151021
- International Announcement: WO2016/077047 WO 20160519
- Main IPC: H01J37/244
- IPC: H01J37/244 ; H01J37/285 ; H01J37/28

Abstract:
Quantitative Secondary Electron Detection (QSED) using the array of solid state devices (SSD) based electron-counters enable critical dimension metrology measurements in materials such as semiconductors, nanomaterials, and biological samples (FIG. 3). Methods and devices effect a quantitative detection of secondary electrons with the array of solid state detectors comprising a number of solid state detectors. An array senses the number of secondary electrons with a plurality of solid state detectors, counting the number of secondary electrons with a time to digital converter circuit in counter mode.
Public/Granted literature
- US20170309445A1 QUANTITATIVE SECONDARY ELECTRON DETECTION Public/Granted day:2017-10-26
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