Invention Grant
- Patent Title: Methods and systems for averaging impedance calibration
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Application No.: US16013827Application Date: 2018-06-20
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Publication No.: US10256817B2Publication Date: 2019-04-09
- Inventor: Dean D. Gans
- Applicant: MICRON TECHNOLOGY, INC.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Fletcher Yoder, P.C.
- Main IPC: H03K19/00
- IPC: H03K19/00 ; G11C11/4093 ; H03K19/0175 ; G11C11/4094 ; G11C29/02 ; H03K19/003 ; G11C7/10 ; G11C29/50
Abstract:
A semiconductor device also includes programmable termination components and a calibration circuit. The calibration circuit generates impedance calibration codes. The calibration circuit also calibrates impedance of the programmable termination components based on an average impedance calibration code of the impedance calibration codes. The semiconductor device further includes an averaging circuit that determines the average impedance calibration code of the impedance calibration codes.
Public/Granted literature
- US20190028102A1 METHODS AND SYSTEMS FOR AVERAGING IMPEDANCE CALIBRATION Public/Granted day:2019-01-24
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