- 专利标题: On-chip waveform measurement
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申请号: US15792819申请日: 2017-10-25
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公开(公告)号: US10263606B2公开(公告)日: 2019-04-16
- 发明人: Andreas Arp , Fatih Cilek , Michael V. Koch , Matthias Ringe
- 申请人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 申请人地址: US NY Armonk
- 专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人: INTERNATIONAL BUSINESS MACHINES CORPORATION
- 当前专利权人地址: US NY Armonk
- 代理机构: Cantor Colburn LLP
- 代理商 Steven Myers
- 主分类号: H03M1/10
- IPC分类号: H03M1/10 ; H03K5/04 ; H03K5/26 ; G04F10/00 ; G01R25/00 ; H03K5/00
摘要:
A circuit for measuring a transition time of a digital signal may be provided. The circuit comprises a window detector comprising a comparator circuitry arranged for generating a first signal based on comparing said digital signal with a first reference voltage and for generating a second signal based on comparing said digital signal with a second reference voltage. Additionally, the circuit comprises a time-difference-to-digital converter operable for converting a delay between an edge of said first signal and an edge of said second signal into a digital value, said digital value characterizing said transition time of said digital signal.
公开/授权文献
- US20180219539A1 ON-CHIP WAVEFORM MEASUREMENT 公开/授权日:2018-08-02
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