Invention Grant
- Patent Title: X-ray generator and adjustment method therefor
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Application No.: US15145107Application Date: 2016-05-03
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Publication No.: US10283313B2Publication Date: 2019-05-07
- Inventor: Masahiro Nonoguchi , Manabu Noguchi , Koichi Kato , Ryuji Nishida , Yuji Kusaka , Masashi Kageyama , Tomohiro Chaki
- Applicant: Rigaku Corporation
- Applicant Address: JP Tokyo
- Assignee: RIGAKU CORPORATION
- Current Assignee: RIGAKU CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Cantor Colburn LLP
- Priority: JP2015-096316 20150511
- Main IPC: H01J35/02
- IPC: H01J35/02 ; H01J35/08 ; H01J35/14 ; H05G1/26 ; H05G1/02

Abstract:
Provided are an X-ray generator capable of easily measuring a beam size of an electron beam on an electron target, and an adjustment method therefor. The X-ray generator includes an electron target including a first metal, a second metal different from the first metal, and a third metal different from the second metal, which are sequentially arranged side by side along a first direction in a continuous manner.
Public/Granted literature
- US20160336140A1 X-RAY GENERATOR AND ADJUSTMENT METHOD THEREFOR Public/Granted day:2016-11-17
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