Invention Grant
- Patent Title: Testing fuse configurations in semiconductor devices
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Application No.: US15395546Application Date: 2016-12-30
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Publication No.: US10302696B2Publication Date: 2019-05-28
- Inventor: Adrian E. Ong , Paul Fuller , Nick van Heel , Mark Thomann
- Applicant: Rambus Inc.
- Applicant Address: US CA Sunnyvale
- Assignee: Rambus Inc.
- Current Assignee: Rambus Inc.
- Current Assignee Address: US CA Sunnyvale
- Agency: Lowenstein Sandler LLP
- Main IPC: G01R31/26
- IPC: G01R31/26 ; G01R31/317 ; G01R31/28
Abstract:
Methods, systems, and apparatus for testing semiconductor devices.
Public/Granted literature
- US20170176533A1 TESTING FUSE CONFIGURATIONS IN SEMICONDUCTOR DEVICES Public/Granted day:2017-06-22
Information query
