Invention Grant
- Patent Title: Memory device and clock training method thereof
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Application No.: US15700324Application Date: 2017-09-11
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Publication No.: US10304547B2Publication Date: 2019-05-28
- Inventor: Yeonkyu Choi , Seungjun Shin
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-Do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si, Gyeonggi-Do
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2016-0141207 20161027
- Main IPC: H01L27/115
- IPC: H01L27/115 ; G11C16/32 ; G11C7/22 ; G11C29/02

Abstract:
A training method for a memory device includes providing, at a memory controller, a clock signal to the memory device to synchronize a control signal at a reference time point of the clock signal. When the clock signal, such as a training clock signal, does not transition after the reference time point, a failure time point is found at which the memory device fails to sample the control signal at the reference time point, based on the clock signal and the control signal. A synchronization time point of the control signal may be set, at which the memory device secures a sampling margin for sampling the control signal at the reference time point, based on the failure time point. A sampler circuit may sample the control signal at an edge of a rising edge of the clock signal.
Public/Granted literature
- US20180122486A1 MEMORY DEVICE AND CLOCK TRAINING METHOD THEREOF Public/Granted day:2018-05-03
Information query
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