- Patent Title: Nonvolatile memory device that applies different recovery voltages to word lines in transition from verification operation to bit line setup operation and program method of the same
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Application No.: US15639459Application Date: 2017-06-30
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Publication No.: US10304549B2Publication Date: 2019-05-28
- Inventor: Ji-Sang Lee
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine, Whitt & Francos, PLLC
- Priority: KR10-2016-0182881 20161229
- Main IPC: G11C16/04
- IPC: G11C16/04 ; G11C16/34 ; G11C16/10 ; G11C16/08 ; G11C16/24

Abstract:
A nonvolatile memory device may include a memory cell array and a control logic. The memory cell array has a plurality of memory cells connected to a plurality of word lines. The control logic controls, in a transition process from a verification step to a bit line setup step for a program operation of the plurality of memory cells, an application of a recovery voltage to a word line among the plurality of word lines. The recovery voltage applied to the word line is different from a recovery voltage applied to other word lines.
Public/Granted literature
- US20180190363A1 NONVOLATILE MEMORY DEVICE AND PROGRAM METHOD OF THE SAME Public/Granted day:2018-07-05
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